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dc.contributor.authorBacelar, W. K.-
dc.contributor.authorOliveira, M. M.-
dc.contributor.authorSouza, V. C.-
dc.contributor.authorLongo, Elson-
dc.contributor.authorLeite, E. R.-
dc.contributor.authorVarela, José Arana-
dc.date.accessioned2014-05-20T15:24:37Z-
dc.date.accessioned2016-10-25T17:58:53Z-
dc.date.available2014-05-20T15:24:37Z-
dc.date.available2016-10-25T17:58:53Z-
dc.date.issued2002-07-01-
dc.identifierhttp://dx.doi.org/10.1023/A:1016092510912-
dc.identifier.citationJournal of Materials Science-materials In Electronics. Dordrecht: Kluwer Academic Publ, v. 13, n. 7, p. 409-414, 2002.-
dc.identifier.issn0957-4522-
dc.identifier.urihttp://hdl.handle.net/11449/35192-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/35192-
dc.description.abstractThe non-ohmic properties of the 98.90% SnO2+(1-x)%CoO+0.05% Cr2O3+0.05% Nb2O5+x% MnO2 varistor system (all of them in mol %), as well as the influence of the oxidizing and reducing atmosphere on this system were studied in this work. Experimental evidence indicates that the electrical properties of the varistor depend on the defects that occur at the grain boundary and on the adsorbed oxygen species such as O''(2), O'(2), O in this region. Thermal treatments at 900 degreesC in oxygen and nitrogen atmospheres indicated such a dependence with the values of the non-linearity coefficient (alpha) increasing under oxygen atmosphere, being reduced in nitrogen atmosphere and restored after a new treatment in oxygen atmosphere, presenting a reversibility in the process. EDS analysis accomplished by SEM showed the distribution of the oxides in the varistor matrix. (C) 2002 Kluwer Academic Publishers.en
dc.format.extent409-414-
dc.language.isoeng-
dc.publisherKluwer Academic Publ-
dc.sourceWeb of Science-
dc.titleInfluence of the oxygen adsorbed on tin varistors doped with Co, Mn and Cr oxidesen
dc.typeoutro-
dc.contributor.institutionUniversidade Federal de São Carlos (UFSCar)-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationUniv Fed Sao Carlos, LIEC Dept Quim, BR-13565905 Sao Carlos, SP, Brazil-
dc.description.affiliationUNESP, Inst Quim, BR-14801970 Araraqara, SP, Brazil-
dc.description.affiliationUnespUNESP, Inst Quim, BR-14801970 Araraqara, SP, Brazil-
dc.identifier.doi10.1023/A:1016092510912-
dc.identifier.wosWOS:000176504400008-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofJournal of Materials Science: Materials in Electronics-
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