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dc.contributor.authorDibb, A.-
dc.contributor.authorTebcherani, S. M.-
dc.contributor.authorLacerda, W.-
dc.contributor.authorCilense, M.-
dc.contributor.authorVarela, José Arana-
dc.contributor.authorLongo, Elson-
dc.date.accessioned2014-05-20T15:25:30Z-
dc.date.accessioned2016-10-25T17:59:59Z-
dc.date.available2014-05-20T15:25:30Z-
dc.date.available2016-10-25T17:59:59Z-
dc.date.issued2002-09-01-
dc.identifierhttp://dx.doi.org/10.1023/A:1019638000939-
dc.identifier.citationJournal of Materials Science-materials In Electronics. Dordrecht: Kluwer Academic Publ, v. 13, n. 9, p. 567-570, 2002.-
dc.identifier.issn0957-4522-
dc.identifier.urihttp://hdl.handle.net/11449/35916-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/35916-
dc.description.abstractThe tin dioxide is an n-type semiconductor, which exhibits varistor behavior with high capacity of absorption of energy, whose function is to restrict transitory over-voltages without being destroyed, when it is doped with some oxides. Varistors are used in alternated current fields as well as in continuous current, and it can be applied in great interval of voltages or in great interval of currents. The electric properties of the varistor depend on the defects that happen at the grain boundaries and the adsorption of oxygen. The (98.90-x)%SnO2.0.25%CoO+0.75%MnO2+0.05%Ta2O5+0.05%Tr2O3 systems, in which Tr=La or Nd. Current-voltage measurements were accomplished for determination of the non-linear coefficient were studied. SEM microstructure analysis was made to evaluate the microstructural characteristics of the systems. The results showed that the rare-earth oxides have influenced the electrical behavior presented by the system. (C) 2002 Kluwer Academic Publishers.en
dc.format.extent567-570-
dc.language.isoeng-
dc.publisherKluwer Academic Publ-
dc.sourceWeb of Science-
dc.titleInfluence of the rare-earths oxides doped on the SnO2CoOMnO2Ta2O5 varistor systemen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.contributor.institutionUniversidade Federal de São Carlos (UFSCar)-
dc.description.affiliationUNESP, Inst Quim, LIEC, CMDMC, BR-14801970 Araraquara, SP, Brazil-
dc.description.affiliationUFSCar, Dept Quim, LIEC, CMDMC, BR-13565905 Sao Carlos, SP, Brazil-
dc.description.affiliationUnespUNESP, Inst Quim, LIEC, CMDMC, BR-14801970 Araraquara, SP, Brazil-
dc.identifier.doi10.1023/A:1019638000939-
dc.identifier.wosWOS:000177328000009-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofJournal of Materials Science: Materials in Electronics-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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