Please use this identifier to cite or link to this item:
http://acervodigital.unesp.br/handle/11449/36496
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Leite, E. R. | - |
dc.contributor.author | Nascimento, A. M. | - |
dc.contributor.author | Bueno, Paulo Roberto | - |
dc.contributor.author | Longo, Elson | - |
dc.contributor.author | Varela, José Arana | - |
dc.date.accessioned | 2014-05-20T15:26:19Z | - |
dc.date.accessioned | 2016-10-25T18:00:53Z | - |
dc.date.available | 2014-05-20T15:26:19Z | - |
dc.date.available | 2016-10-25T18:00:53Z | - |
dc.date.issued | 1999-06-01 | - |
dc.identifier | http://dx.doi.org/10.1023/A:1008933004042 | - |
dc.identifier.citation | Journal of Materials Science-materials In Electronics. Dordrecht: Kluwer Academic Publ, v. 10, n. 4, p. 321-327, 1999. | - |
dc.identifier.issn | 0957-4522 | - |
dc.identifier.uri | http://hdl.handle.net/11449/36496 | - |
dc.identifier.uri | http://acervodigital.unesp.br/handle/11449/36496 | - |
dc.description.abstract | The non-ohmic properties of the 98.95% SnO2 + 1.0 CoO + 0.05 Nb2O5 (all in mole%) system, as well as the influence of sintering temperature and atmosphere on these properties, were characterized in this study. The maximum non-linear coefficient (alpha = 32) was obtained for a sintering temperature of 1300 degrees C in an oxygen atmosphere and this maximum is associated with the presence of O in SnO2 grain boundaries, as interface defects. Experimental results also indicate thermionic-type conduction mechanisms, which are associated with the potential barrier of Schottky or Poole-Frenkel types. | en |
dc.format.extent | 321-327 | - |
dc.language.iso | eng | - |
dc.publisher | Kluwer Academic Publ | - |
dc.source | Web of Science | - |
dc.title | The influence of sintering process and atmosphere on the non-ohmic properties of SnO2 based varistor | en |
dc.type | outro | - |
dc.contributor.institution | Universidade Federal de São Carlos (UFSCar) | - |
dc.contributor.institution | Universidade Estadual Paulista (UNESP) | - |
dc.description.affiliation | Univ Fed Sao Carlos, Dept Quim, BR-13560 Sao Carlos, SP, Brazil | - |
dc.description.affiliation | Univ Estadual Paulista, Inst Quim, BR-14800 Araraquara, SP, Brazil | - |
dc.description.affiliationUnesp | Univ Estadual Paulista, Inst Quim, BR-14800 Araraquara, SP, Brazil | - |
dc.identifier.doi | 10.1023/A:1008933004042 | - |
dc.identifier.wos | WOS:000081340300013 | - |
dc.rights.accessRights | Acesso restrito | - |
dc.relation.ispartof | Journal of Materials Science: Materials in Electronics | - |
Appears in Collections: | Artigos, TCCs, Teses e Dissertações da Unesp |
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.