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DC Field | Value | Language |
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dc.contributor.author | Baldan, C. A. | - |
dc.contributor.author | Shigue, C. Y. | - |
dc.contributor.author | Ruppert, E. | - |
dc.contributor.author | Oliveira, U. R. | - |
dc.date.accessioned | 2014-05-20T15:26:20Z | - |
dc.date.accessioned | 2016-10-25T18:00:55Z | - |
dc.date.available | 2014-05-20T15:26:20Z | - |
dc.date.available | 2016-10-25T18:00:55Z | - |
dc.date.issued | 2005-06-01 | - |
dc.identifier | http://dx.doi.org/10.1109/TASC.2005.849357 | - |
dc.identifier.citation | IEEE Transactions on Applied Superconductivity. Piscataway: IEEE-Inst Electrical Electronics Engineers Inc., v. 15, n. 2, p. 3552-3555, 2005. | - |
dc.identifier.issn | 1051-8223 | - |
dc.identifier.uri | http://hdl.handle.net/11449/36513 | - |
dc.identifier.uri | http://acervodigital.unesp.br/handle/11449/36513 | - |
dc.description.abstract | During the winding process of HTS coils the tapes of Bi-2223 are subjected to the influence of bending strain, axial strain, compressive force and torsional deformation resulting in I-c degradation. In the literature the effects of the individual strain components are separately analyzed in spite of during coil winding and energizing the strain-stress effects are combined. In this work using commercial tapes of Bi-2223 Ag/AgMg with and without stainless steel reinforcement several samples were wound on cylindrical FRP G-10 holder in which different combined strains are applied. Measurements of I - V characteristic curves are done to determine the degree of critical current degradation and the operational limits. The results are compared with the I, values of short samples and other specimens subjected to deformation generated by loading types such as tensile and bending strain. | en |
dc.format.extent | 3552-3555 | - |
dc.language.iso | eng | - |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | - |
dc.source | Web of Science | - |
dc.subject | Bi-2223 tapes | pt |
dc.subject | critical current | pt |
dc.subject | HTS coils | pt |
dc.subject | I-c | pt |
dc.subject | degradation | pt |
dc.subject | stress-strain | pt |
dc.title | Effect of mechanical loading on the I-c degradation behavior of Bi-2223 tapes | en |
dc.type | outro | - |
dc.contributor.institution | Universidade de São Paulo (USP) | - |
dc.contributor.institution | Universidade Estadual Paulista (UNESP) | - |
dc.contributor.institution | Universidade Estadual de Campinas (UNICAMP) | - |
dc.description.affiliation | DEMAR, Dept Mat Engn, FAENQUIL, Fac Engn Quim Lorena, Lorena, SP, Brazil | - |
dc.description.affiliation | UNESP, Fac Engn Guaratingueta, Guaratingueta, SP, Brazil | - |
dc.description.affiliation | Univ Estadual Campinas, Fac Engn Eletr & Computac, Campinas, SP, Brazil | - |
dc.description.affiliationUnesp | UNESP, Fac Engn Guaratingueta, Guaratingueta, SP, Brazil | - |
dc.identifier.doi | 10.1109/TASC.2005.849357 | - |
dc.identifier.wos | WOS:000229767200283 | - |
dc.rights.accessRights | Acesso restrito | - |
dc.relation.ispartof | IEEE Transactions on Applied Superconductivity | - |
Appears in Collections: | Artigos, TCCs, Teses e Dissertações da Unesp |
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