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dc.contributor.authorMessaddeq, S. H.-
dc.contributor.authorLi, M. S.-
dc.contributor.authorWerner, U.-
dc.contributor.authorMessaddeq, Younes-
dc.contributor.authorLezal, D.-
dc.contributor.authorAegerter, M. A.-
dc.identifier.citationApplied Surface Science. Amsterdam: Elsevier B.V., v. 181, n. 1-2, p. 19-27, 2001.-
dc.description.abstractRelief Bragg gratings were recorded on the surface of Ga-Ge-S glass samples by interference of two UV laser beams at 351 nm, Scanning force microscopy was used to perform a 3D image analysis of the resulting surface topography, which shows the superposition of an imprinted grating over the base topography of the glass. An important question regarding the efficiency of the grating is to determine to what extent the base topography reduces the intended coherent scattering of the grating because of its stochastic character. To answer this question we separated both base and grating structures by Fourier filtering, examined both spatial frequency and roughness, and determined the correlation. (C) 2001 Elsevier B.V. B.V. All rights reserved.en
dc.publisherElsevier B.V.-
dc.sourceWeb of Science-
dc.subjectlight-induced effectspt
dc.subjectchalcogenide glassespt
dc.subjectatomic force microscopypt
dc.subjectrelief gratingspt
dc.titleAnalysis of the topography of a Bragg grating in chalcogenide glassen
dc.contributor.institutionUniversidade de São Paulo (USP)-
dc.contributor.institutionInst Neue Mat-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.contributor.institutionIIC ASCR-
dc.description.affiliationUSP, Inst Fis Sao Carlos, BR-13560970 Sao Carlos, SP, Brazil-
dc.description.affiliationInst Neue Mat, D-66123 Saarbrucken, Germany-
dc.description.affiliationUNESP, Inst Quim, BR-14801970 Araraquara, SP, Brazil-
dc.description.affiliationIIC ASCR, Lab Inorgan Mat, Prague 6, Czech Republic-
dc.description.affiliationICT, Prague 6, Czech Republic-
dc.description.affiliationUnespUNESP, Inst Quim, BR-14801970 Araraquara, SP, Brazil-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofApplied Surface Science-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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