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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/36975
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dc.contributor.authorHammer, Peter-
dc.contributor.authorTokumoto, M. S.-
dc.contributor.authorSantilli, Celso Valentim-
dc.contributor.authorPulcinelli, Sandra Helena-
dc.contributor.authorCraievich, A. F.-
dc.contributor.authorSmith, A.-
dc.date.accessioned2014-05-20T15:26:54Z-
dc.date.accessioned2016-10-25T18:01:35Z-
dc.date.available2014-05-20T15:26:54Z-
dc.date.available2016-10-25T18:01:35Z-
dc.date.issued2003-06-01-
dc.identifierhttp://dx.doi.org/10.1107/S0021889803000372-
dc.identifier.citationJournal of Applied Crystallography. Copenhagen: Blackwell Munksgaard, v. 36, p. 435-438, 2003.-
dc.identifier.issn0021-8898-
dc.identifier.urihttp://hdl.handle.net/11449/36975-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/36975-
dc.description.abstractIndium doped ZnO films were deposited by the pyrosol process on glass substrates at different temperatures from solutions containing In/Zn molar ratios up to 10%. The nanostructure of the films was investigated using grazing-incidence small angle X-ray scattering (GISAXS). The mass density was determined by X-ray reflectivity and the composition by X-ray photoelectron spectroscopy. The GISAXS measurements revealed an anisotropic pattern for films deposited at 573 and 623 K and a isotropic one for those deposited at higher temperatures. The anisotropic patterns indicate the presence of elongated nanopores with their long axes perpendicular to the film surface. In contrast, the isotropic nature of GISAXS patterns of films grown at high temperatures (673 and 723 K) suggests the presence of spherical voids. The pore size distribution function determined from the isotropic patterns indicates a multimodal size distribution. on the other hand, the measured mass density of the doped films with isotropic nanotexture is higher than that of the anisotropic films while the electric resistivity is significantly lower. This is in agreement with the detected strong reduction of the void density and specific surface area at approximately constant pore size.en
dc.format.extent435-438-
dc.language.isoeng-
dc.publisherBlackwell Munksgaard-
dc.sourceWeb of Science-
dc.subjectzinc oxidept
dc.subjectnanostructurept
dc.subjectgrazing-incidence small angle X-ray scatteringpt
dc.subjectdensitypt
dc.subjectconductivitypt
dc.titleNanostructure and properties of ZnO films produced by the pyrosol processen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.contributor.institutionUniversidade de São Paulo (USP)-
dc.contributor.institutionGEMH-
dc.description.affiliationUNESP, Inst Quim, BR-14801970 Araraquara, SP, Brazil-
dc.description.affiliationUSP, Inst Fis, BR-09500900 São Paulo, Brazil-
dc.description.affiliationGEMH, ENSCI, F-87065 Limoges, France-
dc.description.affiliationUnespUNESP, Inst Quim, BR-14801970 Araraquara, SP, Brazil-
dc.identifier.doi10.1107/S0021889803000372-
dc.identifier.wosWOS:000182284400011-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofJournal of Applied Crystallography-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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