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dc.contributor.authorGesualdi, M. R. R.-
dc.contributor.authorBarbosa, E. A.-
dc.contributor.authorMuramatsu, M.-
dc.date.accessioned2014-05-20T15:27:26Z-
dc.date.accessioned2016-10-25T18:02:15Z-
dc.date.available2014-05-20T15:27:26Z-
dc.date.available2016-10-25T18:02:15Z-
dc.date.issued2006-08-01-
dc.identifier.citationJournal of Optoelectronics and Advanced Materials. Bucharest-magurele: Natl Inst Optoelectronics, v. 8, n. 4, p. 1574-1583, 2006.-
dc.identifier.issn1454-4164-
dc.identifier.urihttp://hdl.handle.net/11449/37414-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/37414-
dc.description.abstractThis work presents a review of recent developments in phase-stepping real-time holographic interferometry with photorefractive sillenite crystals. Quantitative results are shown in micro-rotation, micro-displacement, and micro-deformation measurements, and in wave-optics and surface analysis as well. The phase stepping was carried out in a four-frame process and the resulting phase map was unwrapped by applying a sin/cos filter. The experimental results are in good agreement with the ones obtained through other means, showing the promising potentialities of phase-stepping real-time holographic interferometry for in situ visualisation, monitoring and analysis in non-destructive testing.en
dc.format.extent1574-1583-
dc.language.isoeng-
dc.publisherNatl Inst Optoelectronics-
dc.sourceWeb of Science-
dc.subjectholographypt
dc.subjectinterferometrypt
dc.subjectphase shiftingpt
dc.titleAdvances in phase-stepping real-time holography using photorefractive sillenite crystalsen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.contributor.institutionUniv Vale Paraiba-
dc.contributor.institutionUniversidade de São Paulo (USP)-
dc.description.affiliationUNESP, CEETEPS, Lab Opt Aplicada, Fac Tecnol São Paulo, BR-01124060 São Paulo, Brazil-
dc.description.affiliationUniv Vale Paraiba, Inst Pesquisa & Desenvolvimento, BR-12244000 Sao Jose Dos Campos, SP, Brazil-
dc.description.affiliationUniv São Paulo, Inst Fis, BR-05508900 São Paulo, Brazil-
dc.description.affiliationUnespUNESP, CEETEPS, Lab Opt Aplicada, Fac Tecnol São Paulo, BR-01124060 São Paulo, Brazil-
dc.identifier.wosWOS:000239874400049-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofJournal of Optoelectronics and Advanced Materials-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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