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dc.contributor.authorBernardi, MIB-
dc.contributor.authorBarrado, C. M.-
dc.contributor.authorSoledade, LEB-
dc.contributor.authorLeite, E. R.-
dc.contributor.authorLongo, Elson-
dc.contributor.authorVarela, José Arana-
dc.date.accessioned2014-05-20T15:28:10Z-
dc.date.accessioned2016-10-25T18:03:09Z-
dc.date.available2014-05-20T15:28:10Z-
dc.date.available2016-10-25T18:03:09Z-
dc.date.issued2002-07-01-
dc.identifierhttp://dx.doi.org/10.1023/A:1016040526841-
dc.identifier.citationJournal of Materials Science-materials In Electronics. Dordrecht: Kluwer Academic Publ, v. 13, n. 7, p. 403-408, 2002.-
dc.identifier.issn0957-4522-
dc.identifier.urihttp://hdl.handle.net/11449/38037-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/38037-
dc.description.abstractAntimony doped tin oxide thin films were deposited on glass by a chemical route derived from Pechini method. Particular emphasis was given to the microstructure of crystallized films. Crystalline phase formation was studied by grazing incident X-ray diffraction and by thermal analyses. Scanning electron microscopy was carried out for microstructure characterization, surface roughness was observed using scanning tunneling microscope and the optical transmittance measurements were performed in the wavelength range of 200-800 nm. (C) 2002 Kluwer Academic Publishers.en
dc.format.extent403-408-
dc.language.isoeng-
dc.publisherKluwer Academic Publ-
dc.sourceWeb of Science-
dc.titleInfluence of heat treatment on the optical properties of SnO2 : Sb thin films deposited by dip coating using aqueous solutionen
dc.typeoutro-
dc.contributor.institutionUniversidade Federal de São Carlos (UFSCar)-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationUFSCar Rod, LIEC Dept Chem, BR-13565905 Sao Carlos, SP, Brazil-
dc.description.affiliationUNESP, IQ, BR-14800900 Araraquara, SP, Brazil-
dc.description.affiliationUnespUNESP, IQ, BR-14800900 Araraquara, SP, Brazil-
dc.identifier.doi10.1023/A:1016040526841-
dc.identifier.wosWOS:000176504400007-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofJournal of Materials Science: Materials in Electronics-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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