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http://acervodigital.unesp.br/handle/11449/39479
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DC Field | Value | Language |
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dc.contributor.author | Yacoub, M. D. | - |
dc.contributor.author | Barbin, M. V. | - |
dc.contributor.author | de Castro, M. S. | - |
dc.contributor.author | Vargas, J. E. | - |
dc.date.accessioned | 2014-05-20T15:30:01Z | - |
dc.date.accessioned | 2016-10-25T18:05:24Z | - |
dc.date.available | 2014-05-20T15:30:01Z | - |
dc.date.available | 2016-10-25T18:05:24Z | - |
dc.date.issued | 2000-02-17 | - |
dc.identifier | http://dx.doi.org/10.1049/el:20000295 | - |
dc.identifier.citation | Electronics Letters. Hertford: IEE-inst Elec Eng, v. 36, n. 4, p. 355-357, 2000. | - |
dc.identifier.issn | 0013-5194 | - |
dc.identifier.uri | http://hdl.handle.net/11449/39479 | - |
dc.identifier.uri | http://acervodigital.unesp.br/handle/11449/39479 | - |
dc.description.abstract | Field trial measurements are used to validate the level crossing rate formula derived in an exact manner recently for the Nakagami-m signal. The formula reveals an excellent fit to measurements in situations other than those for which the Rice model is more appropriate. | en |
dc.format.extent | 355-357 | - |
dc.language.iso | eng | - |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | - |
dc.source | Web of Science | - |
dc.title | Level crossing rate of Nakagami-m fading signal: Field trials and validation | en |
dc.type | outro | - |
dc.contributor.institution | Universidade Estadual de Campinas (UNICAMP) | - |
dc.contributor.institution | Universidade Estadual Paulista (UNESP) | - |
dc.description.affiliation | Univ Estadual Campinas, Sch Elect & Comp Engn, BR-13083970 Campinas, SP, Brazil | - |
dc.description.affiliation | UNESP, Dept Elect Engn, Guaratingueta, SP, Brazil | - |
dc.description.affiliationUnesp | UNESP, Dept Elect Engn, Guaratingueta, SP, Brazil | - |
dc.identifier.doi | 10.1049/el:20000295 | - |
dc.identifier.wos | WOS:000085671500048 | - |
dc.rights.accessRights | Acesso restrito | - |
dc.relation.ispartof | Electronics Letters | - |
Appears in Collections: | Artigos, TCCs, Teses e Dissertações da Unesp |
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