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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/39479
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dc.contributor.authorYacoub, M. D.-
dc.contributor.authorBarbin, M. V.-
dc.contributor.authorde Castro, M. S.-
dc.contributor.authorVargas, J. E.-
dc.date.accessioned2014-05-20T15:30:01Z-
dc.date.accessioned2016-10-25T18:05:24Z-
dc.date.available2014-05-20T15:30:01Z-
dc.date.available2016-10-25T18:05:24Z-
dc.date.issued2000-02-17-
dc.identifierhttp://dx.doi.org/10.1049/el:20000295-
dc.identifier.citationElectronics Letters. Hertford: IEE-inst Elec Eng, v. 36, n. 4, p. 355-357, 2000.-
dc.identifier.issn0013-5194-
dc.identifier.urihttp://hdl.handle.net/11449/39479-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/39479-
dc.description.abstractField trial measurements are used to validate the level crossing rate formula derived in an exact manner recently for the Nakagami-m signal. The formula reveals an excellent fit to measurements in situations other than those for which the Rice model is more appropriate.en
dc.format.extent355-357-
dc.language.isoeng-
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)-
dc.sourceWeb of Science-
dc.titleLevel crossing rate of Nakagami-m fading signal: Field trials and validationen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual de Campinas (UNICAMP)-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationUniv Estadual Campinas, Sch Elect & Comp Engn, BR-13083970 Campinas, SP, Brazil-
dc.description.affiliationUNESP, Dept Elect Engn, Guaratingueta, SP, Brazil-
dc.description.affiliationUnespUNESP, Dept Elect Engn, Guaratingueta, SP, Brazil-
dc.identifier.doi10.1049/el:20000295-
dc.identifier.wosWOS:000085671500048-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofElectronics Letters-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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