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dc.contributor.authorMessaddeq, S. H.-
dc.contributor.authorSchripachev, I.-
dc.contributor.authorRibeiro, Sidney José Lima-
dc.contributor.authorMessaddeq, Younes-
dc.date.accessioned2014-05-20T15:30:45Z-
dc.date.accessioned2016-10-25T18:06:21Z-
dc.date.available2014-05-20T15:30:45Z-
dc.date.available2016-10-25T18:06:21Z-
dc.date.issued2009-11-26-
dc.identifierhttp://dx.doi.org/10.1016/j.ssi.2009.09.011-
dc.identifier.citationSolid State Ionics. Amsterdam: Elsevier B.V., v. 180, n. 32-35, p. 1491-1496, 2009.-
dc.identifier.issn0167-2738-
dc.identifier.urihttp://hdl.handle.net/11449/40065-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/40065-
dc.description.abstractOxysulphide glasses have been prepared in the pseudo binary system GeS(2.6)-Ga(2)O(3). The effect of addition of gallium oxide has been evaluated in term of thermal and optical properties. Structural behavior has been studied using Raman spectroscopy. Samples have been exposed above band gap energy (3.52 eV) varying power density and exposure time. Giant photoexpansion and photorefraction is obtained for samples containing 20% of Ga(2)O(3). (C) 2009 Elsevier B.V. All rights reserved.en
dc.format.extent1491-1496-
dc.language.isoeng-
dc.publisherElsevier B.V.-
dc.sourceWeb of Science-
dc.subjectGeS(2)en
dc.subjectOxysulphideen
dc.subjectPhotoexpansionen
dc.subjectPhotorefractionen
dc.subjectRaman spectroscopyen
dc.titlePhotoexpansion and photorefraction in oxysulphide glassesen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationUNESP, Inst Chem, BR-14800900 Araraquara, SP, Brazil-
dc.description.affiliationUnespUNESP, Inst Chem, BR-14800900 Araraquara, SP, Brazil-
dc.identifier.doi10.1016/j.ssi.2009.09.011-
dc.identifier.wosWOS:000273066400001-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofSolid State Ionics-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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