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dc.contributor.authorGoncalves, R. R.-
dc.contributor.authorGuimaraes, J. J.-
dc.contributor.authorFerrari, J. L.-
dc.contributor.authorMaia, L. J. Q.-
dc.contributor.authorRibeiro, Sidney José Lima-
dc.date.accessioned2014-05-20T15:31:08Z-
dc.date.accessioned2016-10-25T18:06:52Z-
dc.date.available2014-05-20T15:31:08Z-
dc.date.available2016-10-25T18:06:52Z-
dc.date.issued2008-11-01-
dc.identifierhttp://dx.doi.org/10.1016/j.jnoncrysol.2008.05.055-
dc.identifier.citationJournal of Non-crystalline Solids. Amsterdam: Elsevier B.V., v. 354, n. 42-44, p. 4846-4851, 2008.-
dc.identifier.issn0022-3093-
dc.identifier.urihttp://hdl.handle.net/11449/40353-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/40353-
dc.description.abstractEr3+-doped glass-ceramic SiO2-ZrO2 Optical Planar waveguides were prepared by the sol-gel route using different SiO2:ZrO2 molar ratios (90:10, 85:15, 80:20 and 75:25). Multilayered films were deposited onto Si(100) substrates by the dip-coating technique. Structural characterization was performed using vibrational spectroscopy and X-ray diffraction. Some optical properties, densification and surface morphology of these films were investigated as a function of the SiO2:ZrO2 ratio. annealing temperature and time. Optical properties such as refractive index, number of propagating modes and attenuation coefficient were measured at 632.8, 543.5 and 1550 nm, by the prism coupling technique. Uniform surface morphology with roughness less than 0.5 nm. Low losses, less than 0.9 dB/cm at 612.8 nm in the TE0 mode, were measured for the planar waveguides containing up to 25 mol% zirconium oxide. Luminescence of Er3+ in the near infrared was observed for the active nanocomposite. (C) 2008 Elsevier B.V. All rights reserved.en
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)-
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)-
dc.format.extent4846-4851-
dc.language.isoeng-
dc.publisherElsevier B.V.-
dc.sourceWeb of Science-
dc.subjectGlass-ceramicsen
dc.subjectPlanar waveguidesen
dc.subjectAtomic force and scanning tunneling microscopyen
dc.subjectTEM/STEMen
dc.subjectNanocrystalsen
dc.subjectFTIR measurementsen
dc.subjectSilicaen
dc.subjectSilicatesen
dc.subjectSol-gels (xerogels)en
dc.subjectX-ray diffractionen
dc.titleActive planar waveguides based on sol-gel Er3+-doped SiO2-ZrO2 for photonic applications: Morphological, structural and optical propertiesen
dc.typeoutro-
dc.contributor.institutionUniversidade de São Paulo (USP)-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationUSP, Fac Filosofia Ciencias & Letras Ribeirao Preto, Dept Quim, BR-14040901 Ribeirao Preto, SP, Brazil-
dc.description.affiliationUNESP, Inst Quim, Lab Mat Foton, BR-14801970 Araraquara, SP, Brazil-
dc.description.affiliationUnespUNESP, Inst Quim, Lab Mat Foton, BR-14801970 Araraquara, SP, Brazil-
dc.identifier.doi10.1016/j.jnoncrysol.2008.05.055-
dc.identifier.wosWOS:000260883400028-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofJournal of Non-Crystalline Solids-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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