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DC Field | Value | Language |
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dc.contributor.author | Baldan, Carlos Alberto | - |
dc.contributor.author | Shigue, Carlos Y. | - |
dc.contributor.author | Ruppert Filho, Ernesto | - |
dc.date.accessioned | 2014-05-20T15:32:50Z | - |
dc.date.accessioned | 2016-10-25T18:09:12Z | - |
dc.date.available | 2014-05-20T15:32:50Z | - |
dc.date.available | 2016-10-25T18:09:12Z | - |
dc.date.issued | 2008-06-01 | - |
dc.identifier | http://dx.doi.org/10.1109/TASC.2008.920595 | - |
dc.identifier.citation | IEEE Transactions on Applied Superconductivity. Piscataway: IEEE-Inst Electrical Electronics Engineers Inc, v. 18, n. 2, p. 664-667, 2008. | - |
dc.identifier.issn | 1051-8223 | - |
dc.identifier.uri | http://hdl.handle.net/11449/41632 | - |
dc.identifier.uri | http://acervodigital.unesp.br/handle/11449/41632 | - |
dc.description.abstract | A bifilar Bi-2212 bulk coil with parallel shunt resistor was tested under fault current condition using a 3 MVA single-phase transformer in a 220 V-60 Hz line achieving fault current peak of 8 kA. The fault current tests are performed from steady state peak current of 200 A by applying controlled short circuits up to 8 kA varying the time period from one to six cycles. The test results show the function of the shunt resistor providing homogeneous quench behavior of the HTS coil besides its intrinsic stabilizing role. The limiting current ratio achieves a factor 4.2 during 5 cycles without any degradation. | en |
dc.format.extent | 664-667 | - |
dc.language.iso | eng | - |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | - |
dc.source | Web of Science | - |
dc.subject | Bi-2212 bulk coil | en |
dc.subject | HTS bifilar coil | en |
dc.subject | HTS coils | en |
dc.subject | superconducting fault current limiter | en |
dc.title | Fault current test of a bifilar Bi-2212 bulk coil | en |
dc.type | outro | - |
dc.contributor.institution | Universidade Estadual Paulista (UNESP) | - |
dc.contributor.institution | Universidade de São Paulo (USP) | - |
dc.contributor.institution | Universidade Estadual de Campinas (UNICAMP) | - |
dc.description.affiliation | UNESP, Fac Engn, Guaratingueta, SP, Brazil | - |
dc.description.affiliation | Univ São Paulo, EEL, Lorena, SP, Brazil | - |
dc.description.affiliation | Univ Estadual Campinas, Fac Elect & Comp Engn, Campinas, SP, Brazil | - |
dc.description.affiliationUnesp | UNESP, Fac Engn, Guaratingueta, SP, Brazil | - |
dc.identifier.doi | 10.1109/TASC.2008.920595 | - |
dc.identifier.wos | WOS:000256625700139 | - |
dc.rights.accessRights | Acesso restrito | - |
dc.relation.ispartof | IEEE Transactions on Applied Superconductivity | - |
Appears in Collections: | Artigos, TCCs, Teses e Dissertações da Unesp |
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