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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/41632
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dc.contributor.authorBaldan, Carlos Alberto-
dc.contributor.authorShigue, Carlos Y.-
dc.contributor.authorRuppert Filho, Ernesto-
dc.date.accessioned2014-05-20T15:32:50Z-
dc.date.accessioned2016-10-25T18:09:12Z-
dc.date.available2014-05-20T15:32:50Z-
dc.date.available2016-10-25T18:09:12Z-
dc.date.issued2008-06-01-
dc.identifierhttp://dx.doi.org/10.1109/TASC.2008.920595-
dc.identifier.citationIEEE Transactions on Applied Superconductivity. Piscataway: IEEE-Inst Electrical Electronics Engineers Inc, v. 18, n. 2, p. 664-667, 2008.-
dc.identifier.issn1051-8223-
dc.identifier.urihttp://hdl.handle.net/11449/41632-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/41632-
dc.description.abstractA bifilar Bi-2212 bulk coil with parallel shunt resistor was tested under fault current condition using a 3 MVA single-phase transformer in a 220 V-60 Hz line achieving fault current peak of 8 kA. The fault current tests are performed from steady state peak current of 200 A by applying controlled short circuits up to 8 kA varying the time period from one to six cycles. The test results show the function of the shunt resistor providing homogeneous quench behavior of the HTS coil besides its intrinsic stabilizing role. The limiting current ratio achieves a factor 4.2 during 5 cycles without any degradation.en
dc.format.extent664-667-
dc.language.isoeng-
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)-
dc.sourceWeb of Science-
dc.subjectBi-2212 bulk coilen
dc.subjectHTS bifilar coilen
dc.subjectHTS coilsen
dc.subjectsuperconducting fault current limiteren
dc.titleFault current test of a bifilar Bi-2212 bulk coilen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.contributor.institutionUniversidade de São Paulo (USP)-
dc.contributor.institutionUniversidade Estadual de Campinas (UNICAMP)-
dc.description.affiliationUNESP, Fac Engn, Guaratingueta, SP, Brazil-
dc.description.affiliationUniv São Paulo, EEL, Lorena, SP, Brazil-
dc.description.affiliationUniv Estadual Campinas, Fac Elect & Comp Engn, Campinas, SP, Brazil-
dc.description.affiliationUnespUNESP, Fac Engn, Guaratingueta, SP, Brazil-
dc.identifier.doi10.1109/TASC.2008.920595-
dc.identifier.wosWOS:000256625700139-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofIEEE Transactions on Applied Superconductivity-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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