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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/41679
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dc.contributor.authorSimões, Alexandre Zirpoli-
dc.contributor.authorAguiar, E. C.-
dc.contributor.authorLongo, Elson-
dc.contributor.authorVarela, José Arana-
dc.date.accessioned2014-05-20T15:32:54Z-
dc.date.accessioned2016-10-25T18:09:17Z-
dc.date.available2014-05-20T15:32:54Z-
dc.date.available2016-10-25T18:09:17Z-
dc.date.issued2009-05-15-
dc.identifierhttp://dx.doi.org/10.1016/j.matchemphys.2008.12.028-
dc.identifier.citationMaterials Chemistry and Physics. Lausanne: Elsevier B.V. Sa, v. 115, n. 1, p. 434-438, 2009.-
dc.identifier.issn0254-0584-
dc.identifier.urihttp://hdl.handle.net/11449/41679-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/41679-
dc.description.abstractLanthanum-doped bismuth titanate thin films (Bi(3.25)La(0.75)Ti(3)O(12) - BLT) were prepared by the polymeric precursor method and crystallized in the microwave and conventional furnaces. The obtained films are polycrystalline in nature and its ferroelectric properties were determined with remanent polarization P(r) and a coercive field E(c) of 3.9 mu C cm(-2) and 70 kVcm(-1) for the film annealed in the microwave furnace and 20 mu Ccm(-2) and 52 kVcm(-1) for the film annealed in conventional furnace, respectively. Better retention characteristics were observed in the films annealed in conventional furnace, indicating that our films can be a promise material for use in the future FeRAMS memories. (C) 2009 Elsevier B.V. All rights reserved.en
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)-
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)-
dc.description.sponsorshipCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)-
dc.format.extent434-438-
dc.language.isoeng-
dc.publisherElsevier B.V. Sa-
dc.sourceWeb of Science-
dc.subjectThin filmsen
dc.subjectAnnealingen
dc.subjectAtomic force microscopyen
dc.subjectFerroelectricityen
dc.titleRetention characteristics of lanthanum-doped bismuth titanate films annealed at different furnacesen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.contributor.institutionUniversidade Federal de Itajubá (UNIFEI)-
dc.description.affiliationUNESP Paulista State Univ, Inst Chem, BR-14800020 Araraquara, SP, Brazil-
dc.description.affiliationUNIFEI, BR-35900373 Itabira, MG, Brazil-
dc.description.affiliationUnespUNESP Paulista State Univ, Inst Chem, BR-14800020 Araraquara, SP, Brazil-
dc.identifier.doi10.1016/j.matchemphys.2008.12.028-
dc.identifier.wosWOS:000264841900076-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofMaterials Chemistry and Physics-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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