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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/41782
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dc.contributor.authorCastagliola, Philippe-
dc.contributor.authorZhang, Ying-
dc.contributor.authorCosta, Antonio-
dc.contributor.authorMaravelakis, Petros-
dc.date.accessioned2014-05-20T15:33:02Z-
dc.date.accessioned2016-10-25T18:09:28Z-
dc.date.available2014-05-20T15:33:02Z-
dc.date.available2016-10-25T18:09:28Z-
dc.date.issued2012-11-01-
dc.identifierhttp://dx.doi.org/10.1002/qre.1261-
dc.identifier.citationQuality and Reliability Engineering International. Hoboken: Wiley-blackwell, v. 28, n. 7, p. 687-699, 2012.-
dc.identifier.issn0748-8017-
dc.identifier.urihttp://hdl.handle.net/11449/41782-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/41782-
dc.description.abstractThe VSS X chart, dedicated to the detection of small to moderate mean shifts in the process, has been investigated by several researchers under the assumption of known process parameters. In practice, the process parameters are rarely known and are usually estimated from an in-control Phase I data set. In this paper, we evaluate the (run length) performances of the VSS chart when the process parameters are estimated, we compare them in the case where the process parameters are assumed known and we propose specific optimal control chart parameters taking the number of Phase I samples into account.en
dc.format.extent687-699-
dc.language.isoeng-
dc.publisherWiley-Blackwell-
dc.sourceWeb of Science-
dc.subject(X)over-bar charten
dc.subjectadaptative charten
dc.subjectestimated parameteren
dc.subjectrun lengthen
dc.titleThe Variable Sample Size (X)over-bar Chart with Estimated Parametersen
dc.typeoutro-
dc.contributor.institutionUniv Nantes-
dc.contributor.institutionIRCCyN UMR CNRS 6597-
dc.contributor.institutionEcole Cent Nantes-
dc.contributor.institutionWuhan Univ Technol-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.contributor.institutionUniv Aegean-
dc.description.affiliationUniv Nantes, LUNAM Univ, Nantes, France-
dc.description.affiliationIRCCyN UMR CNRS 6597, Nantes, France-
dc.description.affiliationEcole Cent Nantes, Nantes, France-
dc.description.affiliationWuhan Univ Technol, Sch Logist Engn, Wuhan, Peoples R China-
dc.description.affiliationSão Paulo State Univ, Guaratingueta, Brazil-
dc.description.affiliationUniv Aegean, Samos, Greece-
dc.description.affiliationUnespSão Paulo State Univ, Guaratingueta, Brazil-
dc.identifier.doi10.1002/qre.1261-
dc.identifier.wosWOS:000310486600003-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofQuality and Reliability Engineering International-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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