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Campo DC | Valor | Idioma |
---|---|---|
dc.contributor.author | Castagliola, Philippe | - |
dc.contributor.author | Zhang, Ying | - |
dc.contributor.author | Costa, Antonio | - |
dc.contributor.author | Maravelakis, Petros | - |
dc.date.accessioned | 2014-05-20T15:33:02Z | - |
dc.date.accessioned | 2016-10-25T18:09:28Z | - |
dc.date.available | 2014-05-20T15:33:02Z | - |
dc.date.available | 2016-10-25T18:09:28Z | - |
dc.date.issued | 2012-11-01 | - |
dc.identifier | http://dx.doi.org/10.1002/qre.1261 | - |
dc.identifier.citation | Quality and Reliability Engineering International. Hoboken: Wiley-blackwell, v. 28, n. 7, p. 687-699, 2012. | - |
dc.identifier.issn | 0748-8017 | - |
dc.identifier.uri | http://hdl.handle.net/11449/41782 | - |
dc.identifier.uri | http://acervodigital.unesp.br/handle/11449/41782 | - |
dc.description.abstract | The VSS X chart, dedicated to the detection of small to moderate mean shifts in the process, has been investigated by several researchers under the assumption of known process parameters. In practice, the process parameters are rarely known and are usually estimated from an in-control Phase I data set. In this paper, we evaluate the (run length) performances of the VSS chart when the process parameters are estimated, we compare them in the case where the process parameters are assumed known and we propose specific optimal control chart parameters taking the number of Phase I samples into account. | en |
dc.format.extent | 687-699 | - |
dc.language.iso | eng | - |
dc.publisher | Wiley-Blackwell | - |
dc.source | Web of Science | - |
dc.subject | (X)over-bar chart | en |
dc.subject | adaptative chart | en |
dc.subject | estimated parameter | en |
dc.subject | run length | en |
dc.title | The Variable Sample Size (X)over-bar Chart with Estimated Parameters | en |
dc.type | outro | - |
dc.contributor.institution | Univ Nantes | - |
dc.contributor.institution | IRCCyN UMR CNRS 6597 | - |
dc.contributor.institution | Ecole Cent Nantes | - |
dc.contributor.institution | Wuhan Univ Technol | - |
dc.contributor.institution | Universidade Estadual Paulista (UNESP) | - |
dc.contributor.institution | Univ Aegean | - |
dc.description.affiliation | Univ Nantes, LUNAM Univ, Nantes, France | - |
dc.description.affiliation | IRCCyN UMR CNRS 6597, Nantes, France | - |
dc.description.affiliation | Ecole Cent Nantes, Nantes, France | - |
dc.description.affiliation | Wuhan Univ Technol, Sch Logist Engn, Wuhan, Peoples R China | - |
dc.description.affiliation | São Paulo State Univ, Guaratingueta, Brazil | - |
dc.description.affiliation | Univ Aegean, Samos, Greece | - |
dc.description.affiliationUnesp | São Paulo State Univ, Guaratingueta, Brazil | - |
dc.identifier.doi | 10.1002/qre.1261 | - |
dc.identifier.wos | WOS:000310486600003 | - |
dc.rights.accessRights | Acesso restrito | - |
dc.relation.ispartof | Quality and Reliability Engineering International | - |
Aparece nas coleções: | Artigos, TCCs, Teses e Dissertações da Unesp |
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