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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/42192
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dc.contributor.authorBarbosa, Eduardo A.-
dc.contributor.authordos Santos, Silas C.-
dc.date.accessioned2014-05-20T15:33:37Z-
dc.date.accessioned2016-10-25T18:10:15Z-
dc.date.available2014-05-20T15:33:37Z-
dc.date.available2016-10-25T18:10:15Z-
dc.date.issued2008-03-01-
dc.identifierhttp://dx.doi.org/10.1016/j.optcom.2007.10.077-
dc.identifier.citationOptics Communications. Amsterdam: Elsevier B.V., v. 281, n. 5, p. 1022-1029, 2008.-
dc.identifier.issn0030-4018-
dc.identifier.urihttp://hdl.handle.net/11449/42192-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/42192-
dc.description.abstractPhysical parameters of different types of lenses were measured through digital speckle pattern interferometry (DSPI) using a multimode diode laser as light source. When such lasers emit two or more longitudinal modes simultaneously the speckle image of an object appears covered of contour fringes. By performing the quantitative fringe evaluation the radii of curvature as well as the refractive indexes of the lenses were determined. The fringe quantitative evaluation was carried out through the four- and the eight-stepping techniques and the branch-cut method was employed for phase unwrapping. With all these parameters the focal length was calculated. This whole-field multi-wavelength method does enable the characterization of spherical and aspherical lenses and of positive and negative ones as well. (C) 2007 Elsevier B.V. All rights reserved.en
dc.format.extent1022-1029-
dc.language.isoeng-
dc.publisherElsevier B.V.-
dc.sourceWeb of Science-
dc.subjectspeckleen
dc.subjectDSPL synthetic wavelengthen
dc.subjectlens measurementen
dc.titleRefractive and geometric lens characterization through multi-wavelength digital speckle pattern interferometryen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationUniv Estadual Paulista, CEETEPS, Fac Tecnol São Paulo, Lab Opt Aplicada, BR-01124060 São Paulo, Brazil-
dc.description.affiliationUnespUniv Estadual Paulista, CEETEPS, Fac Tecnol São Paulo, Lab Opt Aplicada, BR-01124060 São Paulo, Brazil-
dc.identifier.doi10.1016/j.optcom.2007.10.077-
dc.identifier.wosWOS:000252762900017-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofOptics Communications-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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