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dc.contributor.authorGoncalves, Agnaldo de Souza-
dc.contributor.authorDavolos, Marian Rosaly-
dc.contributor.authorMasaki, Naruhiko-
dc.contributor.authorYanagida, Shozo-
dc.contributor.authorMori, Shogo-
dc.contributor.authorNogueira, Ana F.-
dc.date.accessioned2014-05-20T15:34:02Z-
dc.date.accessioned2016-10-25T18:10:39Z-
dc.date.available2014-05-20T15:34:02Z-
dc.date.available2016-10-25T18:10:39Z-
dc.date.issued2009-09-15-
dc.identifierhttp://dx.doi.org/10.1063/1.3226073-
dc.identifier.citationJournal of Applied Physics. Melville: Amer Inst Physics, v. 106, n. 6, p. 4, 2009.-
dc.identifier.issn0021-8979-
dc.identifier.urihttp://hdl.handle.net/11449/42401-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/42401-
dc.description.abstractIn order to explain the higher short-circuit current (J(sc)) with comparable open-circuit voltage (V(oc)) from dye-sensitized solar cells (DSCs) based on gallium-modified ZnO (ZnO:Ga) porous electrodes, the diffusion coefficient (D) and electron lifetime (tau) in DSCs with and without Ga-modified ZnO were studied by stepped light-induced transient measurements of photocurrent and voltage. In comparison to DSCs based on ZnO electrodes, the ZnO:Ga-based solar cells provided lower D and higher tau values. The results were interpreted according to the transport-limited recombination model, where the Ga modification induced a higher density of intraband charge traps. At matched electron densities, a decrease in V(oc) from DSCs based on ZnO:Ga was observed, suggesting a positive shift of the ZnO:Ga conduction band edge. The higher J(sc) can be explained by the positive shift of the ZnO:Ga conduction band edge in addition to the increased roughness factor of the electrode due to the Ga modification. (C) 2009 American Institute of Physics. [doi:10.1063/1.3226073]en
dc.description.sponsorshipCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)-
dc.description.sponsorshipRenami-
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)-
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)-
dc.format.extent4-
dc.language.isoeng-
dc.publisherAmerican Institute of Physics (AIP)-
dc.sourceWeb of Science-
dc.titleStepped light-induced transient measurements of photocurrent and voltage in dye-sensitized solar cells based on ZnO and ZnO:Gaen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.contributor.institutionOsaka Univ-
dc.contributor.institutionUniversidade Estadual de Campinas (UNICAMP)-
dc.contributor.institutionShinshu Univ-
dc.description.affiliationUniv Estadual Paulista, Inst Chem, BR-14800900 Araraquara, SP, Brazil-
dc.description.affiliationOsaka Univ, Ctr Adv Sci & Innovat, Suita, Osaka 5650871, Japan-
dc.description.affiliationUniv Estadual Campinas, Inst Chem, BR-13083970 Campinas, SP, Brazil-
dc.description.affiliationShinshu Univ, Dept Fine Mat Engn, Ueda, Nagano 3868567, Japan-
dc.description.affiliationUnespUniv Estadual Paulista, Inst Chem, BR-14800900 Araraquara, SP, Brazil-
dc.identifier.doi10.1063/1.3226073-
dc.identifier.wosWOS:000270378100134-
dc.rights.accessRightsAcesso restrito-
dc.identifier.fileWOS000270378100134.pdf-
dc.relation.ispartofJournal of Applied Physics-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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