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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/64489
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dc.contributor.authorCosta, Antonio F B-
dc.date.accessioned2014-05-27T11:17:57Z-
dc.date.accessioned2016-10-25T18:13:20Z-
dc.date.available2014-05-27T11:17:57Z-
dc.date.available2016-10-25T18:13:20Z-
dc.date.issued1994-07-01-
dc.identifier.citationJournal of Quality Technology, v. 26, n. 3, p. 155-163, 1994.-
dc.identifier.issn0022-4065-
dc.identifier.urihttp://hdl.handle.net/11449/64489-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/64489-
dc.description.abstractThe usual practice in using a control chart to monitor a process is to take samples of size n from the process every h hours. This article considers the properties of the X̄ chart when the size of each sample depends on what is observed in the preceding sample. The idea is that the sample should be large if the sample point of the preceding sample is close to but not actually outside the control limits and small if the sample point is close to the target. The properties of the variable sample size (VSS) X̄ chart are obtained using Markov chains. The VSS X̄ chart is substantially quicker than the traditional X̄ chart in detecting moderate shifts in the process.en
dc.format.extent155-163-
dc.language.isoeng-
dc.sourceScopus-
dc.subjectGraphic methods-
dc.subjectMonitoring-
dc.subjectPerformance-
dc.subjectProcess engineering-
dc.subjectRandom processes-
dc.subjectSampling-
dc.subjectStatistical methods-
dc.subjectControl charts-
dc.subjectDouble sampling-
dc.subjectStandard deviation-
dc.subjectStatistical control-
dc.subjectVariable sample size-
dc.subjectProcess control-
dc.titleX̄ charts with variable sample sizeen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationFEG-UNESP, Guaratingueta-
dc.description.affiliationUnespFEG-UNESP, Guaratingueta-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofJournal of Quality Technology-
dc.identifier.scopus2-s2.0-0028467136-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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