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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/65239
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dc.contributor.authorGupta, H. M.-
dc.date.accessioned2014-05-27T11:18:17Z-
dc.date.accessioned2016-10-25T18:14:42Z-
dc.date.available2014-05-27T11:18:17Z-
dc.date.available2016-10-25T18:14:42Z-
dc.date.issued1997-12-01-
dc.identifierhttp://dx.doi.org/10.1002/1521-396X(199712)164:2<733::AID-PSSA733>3.0.CO;2-N-
dc.identifierhttp://onlinelibrary.wiley.com/doi/10.1002/1521-396X%28199712%29164:2%3C733::AID-PSSA733%3E3.0.CO;2-N/abstract-
dc.identifier.citationPhysica Status Solidi (A) Applied Research, v. 164, n. 2, p. 733-745, 1997.-
dc.identifier.issn0031-8965-
dc.identifier.urihttp://hdl.handle.net/11449/65239-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/65239-
dc.description.abstractIn the present paper, we discuss a generalized theory of electrical characteristics for amorphous semiconductor (or insulator) Schottky barriers, considering: (i) surface states, (ii) doping impurity states at a single energy level and (iii) energetically distributed bulk impurity states. We also consider a thin oxide layer (≈10 Å) between metal and semiconductor. We develop current versus applied potential characteristics considering the variation of the Fermi level very close to contact inside the semiconductor and decrease in barrier height due to the image force effect as well as potential fall on the oxide layer. Finally, we discuss the importance of each parameter, i.e. surface states, distributed impurity states, doping impurity states, thickness of oxide layer etc. on the log I versus applied potential characteristics. The present theory is also applicable for intimate contact, i.e. metal-semiconductor contact, crystalline material structures or for Schottky barriers in insulators or polymers.en
dc.format.extent733-745-
dc.language.isoeng-
dc.sourceScopus-
dc.subjectAmorphous materials-
dc.subjectCurrent voltage characteristics-
dc.subjectElectric currents-
dc.subjectFermi level-
dc.subjectSemiconductor doping-
dc.subjectImage force effects-
dc.subjectSchottky barrier diodes-
dc.titleA generalized theory of electrical characteristics of schottky barriers for amorphous materialsen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationDepartamento de Física Inst. de Geociencias e Cie. Exatas Universidade Estadual Paulista, Cx.P. 178, 13500-970 Rio Claro, SP-
dc.description.affiliationUnespDepartamento de Física Inst. de Geociencias e Cie. Exatas Universidade Estadual Paulista, Cx.P. 178, 13500-970 Rio Claro, SP-
dc.identifier.doi10.1002/1521-396X(199712)164:2<733::AID-PSSA733>3.0.CO;2-N-
dc.identifier.wosWOS:000071784200014-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofPhysica Status Solidi A: Applied Research-
dc.identifier.scopus2-s2.0-0031334407-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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