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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/65590
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dc.contributor.authorMessias, Fábio R.-
dc.contributor.authorScalvi, Luis Vicente de Andrade-
dc.contributor.authorLi, M. Siu-
dc.contributor.authorSantilli, C. V.-
dc.contributor.authorPulcinelli, S. H.-
dc.date.accessioned2014-05-27T11:19:39Z-
dc.date.accessioned2016-10-25T18:15:23Z-
dc.date.available2014-05-27T11:19:39Z-
dc.date.available2016-10-25T18:15:23Z-
dc.date.issued1998-12-01-
dc.identifierhttp://dx.doi.org/10.1080/10420159808220291-
dc.identifier.citationRadiation Effects and Defects in Solids, v. 146, n. 1-4, p. 199-206, 1998.-
dc.identifier.issn1042-0150-
dc.identifier.urihttp://hdl.handle.net/11449/65590-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/65590-
dc.description.abstractThin films of undoped and Sb-doped (2 atg%) SnO2 have been prepared by sol-gel dip-coating technique on borosilicate glasses. Variation of photoconductivity excitation with wavelength and optical absorption indicate indirect bandgap transition with energy of ≅ 3.5 eV. Conductance as function of temperature indicates two levels of capture with 39 and 81 meV as activation energies, which may be related to an Sb donor and oxygen vacancy respectively. Electron trapping by these levels are practically destroyed by UV photoexcitation (305 nm) and heating in vacuum to 200°C. Gas analysis using a mass spectrometer indicates an oxygen related level, which may not be desorbed in the simpler O2 form.en
dc.format.extent199-206-
dc.language.isoeng-
dc.sourceScopus-
dc.subjectOptical absorption-
dc.subjectOxygen vacancy-
dc.subjectPhotoconductivity-
dc.subjectTin dioxide-
dc.subjectTraps-
dc.subjectWide gap semiconductor-
dc.subjectActivation energy-
dc.subjectBorosilicate glass-
dc.subjectCoating techniques-
dc.subjectDesorption-
dc.subjectElectric conductance-
dc.subjectHeating-
dc.subjectMass spectrometers-
dc.subjectSemiconducting tin compounds-
dc.subjectSemiconductor growth-
dc.subjectSol-gels-
dc.subjectThin films-
dc.subjectUltraviolet radiation-
dc.subjectElectron trapping-
dc.subjectPhotodesorption-
dc.subjectSol-gel dip-coating techniques-
dc.subjectSemiconducting films-
dc.titlePhotodesorption and electron trapping in n-type SnO2 thin films grown by dip-coating techniqueen
dc.typeoutro-
dc.contributor.institutionUniversidade de São Paulo (USP)-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationInst. de Fis. de São Carlos U.S.P., Caixa Postal 369, São Carlos SP 13560-970-
dc.description.affiliationDepartamento de Física-FC UNESP Campus Bauru, Caixa Postal 473, Bauru SP 17033-360-
dc.description.affiliationInstituto de Química UNESP Campus Araraquara, Caixa Postal 355, Araraquara SP 14801-907-
dc.description.affiliationUnespDepartamento de Física-FC UNESP Campus Bauru, Caixa Postal 473, Bauru SP 17033-360-
dc.description.affiliationUnespInstituto de Química UNESP Campus Araraquara, Caixa Postal 355, Araraquara SP 14801-907-
dc.identifier.doi10.1080/10420159808220291-
dc.identifier.wosWOS:000079993400017-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofRadiation Effects and Defects in Solids-
dc.identifier.scopus2-s2.0-0032308896-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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