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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/65923
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dc.contributor.authorScalvi, Luis Vicente de Andrade-
dc.contributor.authorMessias, Fábio R.-
dc.contributor.authorSouza, A. E.-
dc.contributor.authorLi, M. Siu-
dc.contributor.authorSantilli, C. V.-
dc.contributor.authorPulcinelli, S. H.-
dc.date.accessioned2014-05-27T11:19:48Z-
dc.date.accessioned2016-10-25T18:15:58Z-
dc.date.available2014-05-27T11:19:48Z-
dc.date.available2016-10-25T18:15:58Z-
dc.date.issued1999-12-01-
dc.identifierhttp://dx.doi.org/10.1023/A:1008634131282-
dc.identifier.citationJournal of Sol-Gel Science and Technology, v. 13, n. 1-3, p. 793-798, 1999.-
dc.identifier.issn0928-0707-
dc.identifier.urihttp://hdl.handle.net/11449/65923-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/65923-
dc.description.abstractThin films of undoped and Sb-doped SnO2 have been prepared by a sol-gel dip-coating technique. For the high doping level (2-3 mol% Sb) n-type degenerate conduction is expected, however, measurements of resistance as a function of temperature show that doped samples exhibit strong electron trapping, with capture levels at 39 and 81 meV. Heating in a vacuum and irradiation with UV monochromatic light (305 nm) improve the electrical characteristics, decreasing the carrier capture at low temperature. This suggests an oxygen related level, which can be eliminated by a photodesorption process. Absorption spectral dependence indicates an indirect bandgap transition with Eg ≅ 3.5 eV. Current-voltage characteristics indicate a thermionic emission mechanism through interfacial states.en
dc.format.extent793-798-
dc.language.isoeng-
dc.sourceScopus-
dc.subjectElectronic transport-
dc.subjectImpurities in semiconductors-
dc.subjectRecombination and trapping-
dc.subjectThin films-
dc.subjectCharge carriers-
dc.subjectCurrent voltage characteristics-
dc.subjectDesorption-
dc.subjectElectric resistance measurement-
dc.subjectElectron transport properties-
dc.subjectEnergy gap-
dc.subjectSemiconducting antimony-
dc.subjectSemiconducting tin compounds-
dc.subjectSemiconductor doping-
dc.subjectSol-gels-
dc.subjectThermal effects-
dc.subjectUltraviolet radiation-
dc.subjectAbsorption spectroscopy-
dc.subjectApproximation theory-
dc.subjectCoating techniques-
dc.subjectMonochromators-
dc.subjectSemiconductor materials-
dc.subjectSingle crystals-
dc.subjectDip coating-
dc.subjectPhotodesorption-
dc.subjectPhotodesorption process-
dc.subjectSemiconducting films-
dc.subjectTin compounds-
dc.titleImproved Conductivity Induced by Photodesorption in SnO2 Thin Films Grown by a Sol-Gel Dip Coating Techniqueen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.contributor.institutionUniversidade de São Paulo (USP)-
dc.description.affiliationDepartamento de Física FC UNESP, Caixa Postal 473, 17033-360 Bauru SP-
dc.description.affiliationInst. de Fis. de Sao Carlos U.S.P., Caixa Postal 369, 13560-970 São Carlos SP-
dc.description.affiliationInstituto de Química UNESP, Caixa Postal 355, 14801-907 Araraquara SP-
dc.description.affiliationUnespDepartamento de Física FC UNESP, Caixa Postal 473, 17033-360 Bauru SP-
dc.description.affiliationUnespInstituto de Química UNESP, Caixa Postal 355, 14801-907 Araraquara SP-
dc.identifier.doi10.1023/A:1008634131282-
dc.identifier.wosWOS:000078468200140-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofJournal of Sol-Gel Science and Technology-
dc.identifier.scopus2-s2.0-0032312616-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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