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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/68532
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dc.contributor.authorLeguenza, E. L.-
dc.contributor.authorRobert, R.-
dc.contributor.authorMoura, W. A.-
dc.contributor.authorGiacometti, J. A.-
dc.date.accessioned2014-05-27T11:21:41Z-
dc.date.accessioned2016-10-25T18:21:24Z-
dc.date.available2014-05-27T11:21:41Z-
dc.date.available2016-10-25T18:21:24Z-
dc.date.issued2005-12-01-
dc.identifierhttp://dx.doi.org/10.1109/ISE.2005.1612369-
dc.identifier.citationProceedings - International Symposium on Electrets, v. 2005, p. 254-257.-
dc.identifier.urihttp://hdl.handle.net/11449/68532-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/68532-
dc.description.abstractIn this work fresh cables were laboratory aged under multi-stressing conditions at room temperature. Foils were peeled from cables, with approximately 150 ?m thickness, from the outer, middle and inner positions of the XLPE cable insulating layer. For samples obtained from the outer cable layer position, an increasing near-permanent electrical conduction process with aging time was observed. At the middle and inner cable layer positions a flat-loss relaxation process was observed becoming a dominating process on the ageing. In addition, PEA results confirmed that degradation in the outer region of the XLPE cables arises from the simultaneous presence of dipoles and injected space charge that distorts the internal electric field on the ageing.en
dc.format.extent254-257-
dc.language.isoeng-
dc.sourceScopus-
dc.subjectDielectric properties-
dc.subjectElectric conductivity-
dc.subjectElectric insulation-
dc.subjectStress relaxation-
dc.subjectThermal stress-
dc.subjectDielectric behavior-
dc.subjectInsulating layers-
dc.subjectMulti stressing conditions-
dc.subjectRoom temperature-
dc.subjectElectric cables-
dc.titleDielectric behavior of XLPE aged under multi-stressing conditionsen
dc.typeoutro-
dc.contributor.institutionCentro Universitário Positivo UNICENP-
dc.contributor.institutionUniversidade Federal do Paraná (UFPR)-
dc.contributor.institutionCentro Federal de Educação Tecnológica (CEFET)-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationNúcleo de Ciências Exatas e Tecnológicas Engenharia da Computação Centro Universitário Positivo UNICENP, 81280-330, Curitiba PR-
dc.description.affiliationLACTEC UFPR/Copel, C.P. 19067, 81531-970, Curitiba PR-
dc.description.affiliationDepartamento de Engenharia Elétrica Universidade Federal do Paraná - UFPR, C.P. 19047, 81931-990, Curitiba PR-
dc.description.affiliationCentro Federal de Educação Tecnológica CEFET, Cuiabá - MT-
dc.description.affiliationFaculdade de Ciência e Tecnologia Universidade Estadual Paulista- UNESP, 19060-900, Presidente Prudente SP-
dc.description.affiliationUnespFaculdade de Ciência e Tecnologia Universidade Estadual Paulista- UNESP, 19060-900, Presidente Prudente SP-
dc.identifier.doi10.1109/ISE.2005.1612369-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofProceedings - International Symposium on Electrets-
dc.identifier.scopus2-s2.0-33847730579-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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