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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/71315
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dc.contributor.authorSimões, Alexandre Zirpoli-
dc.contributor.authorGarcia, Filiberto Gonzalez-
dc.contributor.authorMoura, Francisco-
dc.date.accessioned2014-05-27T11:24:04Z-
dc.date.accessioned2016-10-25T18:27:48Z-
dc.date.available2014-05-27T11:24:04Z-
dc.date.available2016-10-25T18:27:48Z-
dc.date.issued2009-12-01-
dc.identifierhttp://dx.doi.org/10.1166/jspm.2009.1014-
dc.identifier.citationJournal of Scanning Probe Microscopy, v. 4, n. 2, p. 94-99, 2009.-
dc.identifier.issn1557-7937-
dc.identifier.urihttp://hdl.handle.net/11449/71315-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/71315-
dc.description.abstractThis paper focuses on the magnetoelectric coupling (ME) at room temperature in lanthanum modified bismuth ferrite thin film (BLFO) deposited on SrRuO 3-buffered Pt/TiO 2/SiO 2/Si(100) substrates by the soft chemical method. BLFO film was coherently grown at a temperature of 500 °C. The magnetoelectric coefficient measurement was performed to evidence magnetoelectric coupling behavior. Room temperature magnetic coercive field indicates that the film is magnetically soft. The maximum magnetoelectric coefficient in the longitudinal direction was close to 12 V/cmOe. Dielectric permittivity and dielectric loss demonstrated only slight dispersion with frequency due the less two-dimensional stress in the plane of the film. Polarization reversal was investigated by applying dc voltage through a conductive tip during the area scanning. We observed that various types of domain behavior such as 71 ° and 180° domain switching, and pinned domain formation occurred. Copyright © 2009 American Scientific Publishers All rights reserved.en
dc.format.extent94-99-
dc.language.isoeng-
dc.sourceScopus-
dc.subjectCeramics-
dc.subjectChemical syntheses-
dc.subjectDieletric response-
dc.subjectMultiferroics-
dc.subjectPiezoelectric force microscopy-
dc.subjectPiezoelectricity-
dc.subjectBismuth ferrites-
dc.subjectChemical method-
dc.subjectChemical synthesis-
dc.subjectCoercive field-
dc.subjectDC voltage-
dc.subjectDielectric permittivities-
dc.subjectDomain behavior-
dc.subjectDomain formation-
dc.subjectDomain switchings-
dc.subjectLongitudinal direction-
dc.subjectMagnetoelectric coefficients-
dc.subjectMagnetoelectric couplings-
dc.subjectPolarization reversals-
dc.subjectRoom temperature-
dc.subjectSi (100) substrate-
dc.subjectSoft chemical method-
dc.subjectStrontium ruthenates-
dc.subjectTwo-dimensional stress-
dc.subjectBismuth-
dc.subjectCeramic materials-
dc.subjectCrystallography-
dc.subjectDielectric losses-
dc.subjectElectric force microscopy-
dc.subjectElectromagnetic coupling-
dc.subjectFerrite-
dc.subjectLanthanum-
dc.subjectLanthanum alloys-
dc.subjectMagnetic domains-
dc.subjectPiezoelectric devices-
dc.subjectSilicon compounds-
dc.subjectStrontium-
dc.subjectSynthesis (chemical)-
dc.subjectThin films-
dc.subjectComposite micromechanics-
dc.titleMagnetoelectric coefficient in strontium ruthenate buffered lanthanum modified bismuth ferrite thin films grown by chemical methoden
dc.typeoutro-
dc.contributor.institutionUniversidade Federal de Itajubá (UNIFEI)-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationUniversidade Federal de Itajubá-Unifei-Campus Itabira, Rua São Paulo 377, 35900-37 Bairro Amazonas, Itabira, Minas Gerais-
dc.description.affiliationLaboratório Interdisciplinar em Cerâmica Instituto de Química Universidade Estadual Paulista, P O. Box 355, 14801-907 Araraquara, São Paulo-
dc.description.affiliationUnespLaboratório Interdisciplinar em Cerâmica Instituto de Química Universidade Estadual Paulista, P O. Box 355, 14801-907 Araraquara, São Paulo-
dc.identifier.doi10.1166/jspm.2009.1014-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofJournal of Scanning Probe Microscopy-
dc.identifier.scopus2-s2.0-77951776270-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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