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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/72068
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dc.contributor.authorAguiar, Ederson Carlos-
dc.contributor.authorSimões, Alexandre Zirpoli-
dc.contributor.authorLongo, Elson-
dc.contributor.authorVarela, José Arana-
dc.date.accessioned2014-05-27T11:25:21Z-
dc.date.accessioned2016-10-25T18:33:00Z-
dc.date.available2014-05-27T11:25:21Z-
dc.date.available2016-10-25T18:33:00Z-
dc.date.issued2010-12-01-
dc.identifierhttp://dx.doi.org/10.1166/jamr.2010.1044-
dc.identifier.citationJournal of Advanced Microscopy Research, v. 5, n. 3, p. 209-216, 2010.-
dc.identifier.issn2156-7573-
dc.identifier.issn2156-7581-
dc.identifier.urihttp://hdl.handle.net/11449/72068-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/72068-
dc.description.abstractBismuth titanate ceramics (Bi 4Ti 3O 12) with 10 wt% in excess of bismuth (BIT10) were prepared by the polymeric precursor method and sinterized in microwave (MW) and conventional furnaces (CF). The effect of microwave energy on structural and electrical behavior of BIT10 ceramics was investigated by means of X-ray diffraction (XRD), Scanning electron microscopy (SEM) and electrical measurements. The results of the BIT10 ceramics processed in the microwave furnace (MW) showed a high structural organization compared to conventional treatment (CF). Size of grains and dieletrical properties are influenced by annealing conditions while coercitive field is not dependent on it. The maximum dielectric permittivity (12000) was obtained for the sample sintered in the microwave furnace. Piezoelectric force microscopy images reveals that in-plane response may not change its sign upon polarization switching, while the out-of-plane response does with the influence of microwave energy. Copyright © 2010 American Scientific Publishers All rights reserved.en
dc.format.extent209-216-
dc.language.isoeng-
dc.sourceScopus-
dc.subjectBi 4Ti 3O 12-
dc.subjectDielectric response-
dc.subjectMicrostructure-
dc.subjectMicrowave sintering-
dc.subjectPiezoelectric force microscopy-
dc.subjectScanning electron microscopy-
dc.subjectX-ray diffraction-
dc.subjectAnnealing condition-
dc.subjectBismuth titanate ceramics-
dc.subjectConventional furnace-
dc.subjectConventional treatments-
dc.subjectDielectric permittivities-
dc.subjectElectrical behaviors-
dc.subjectElectrical measurement-
dc.subjectMicrowave energies-
dc.subjectMicrowave furnace-
dc.subjectOut-of-plane-
dc.subjectPiezoelectric response-
dc.subjectPolarization switching-
dc.subjectPolymeric precursor methods-
dc.subjectStructural organization-
dc.subjectX ray diffraction-
dc.titleInfluence of microwave energy on structural and piezoelectric response of Bi 4Ti 3O 12 ceramicsen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationLaboratório Interdisciplinar em Cerâmica Instituto de Química Universidade Estadual Paulista, P.O. Box 355, 14801-907, Araraquara, São Paulo-
dc.description.affiliationUniversidade Estadual Paulista-Unesp Faculdade de Engenharia de Campus Itabira, Av. Dr Ariberto Pereira da Cunha 333, 12.516-410, Guaratinguetá, São Paulo-
dc.description.affiliationUnespLaboratório Interdisciplinar em Cerâmica Instituto de Química Universidade Estadual Paulista, P.O. Box 355, 14801-907, Araraquara, São Paulo-
dc.description.affiliationUnespUniversidade Estadual Paulista-Unesp Faculdade de Engenharia de Campus Itabira, Av. Dr Ariberto Pereira da Cunha 333, 12.516-410, Guaratinguetá, São Paulo-
dc.identifier.doi10.1166/jamr.2010.1044-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofJournal of Advanced Microscopy Research-
dc.identifier.scopus2-s2.0-84867560170-
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