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http://acervodigital.unesp.br/handle/11449/72069
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DC Field | Value | Language |
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dc.contributor.author | Moura, Francisco | - |
dc.contributor.author | Simões, Alexandre Zirpoli | - |
dc.contributor.author | Zaghete, Maria Aparecida | - |
dc.contributor.author | Varela, José Arana | - |
dc.contributor.author | Longo, Elson | - |
dc.date.accessioned | 2014-05-27T11:25:21Z | - |
dc.date.accessioned | 2016-10-25T18:33:00Z | - |
dc.date.available | 2014-05-27T11:25:21Z | - |
dc.date.available | 2016-10-25T18:33:00Z | - |
dc.date.issued | 2010-12-01 | - |
dc.identifier | http://dx.doi.org/10.1166/jamr.2010.1046 | - |
dc.identifier.citation | Journal of Advanced Microscopy Research, v. 5, n. 3, p. 223-231, 2010. | - |
dc.identifier.issn | 2156-7573 | - |
dc.identifier.issn | 2156-7581 | - |
dc.identifier.uri | http://hdl.handle.net/11449/72069 | - |
dc.identifier.uri | http://acervodigital.unesp.br/handle/11449/72069 | - |
dc.description.abstract | Dielectric spectroscopy was used in this study to examine polycrystalline vanadium and tungstendoped BaZr 0.1Ti 0.90O 3 (BZT10:2V and BZT10:2W) ceramics obtained by the mixed oxide method. According to X-ray diffraction analyses, addition of vanadium and tungsten lead to ceramics free of secondary phases. SEM analyses reveal that both dopants result in slower oxygen ion motion and consequently lower grain growth rate. Temperature dependence dielectric study showed normal ferroelectric to paraelectric transition well above the room temperature for the BZT10 and BZT10:2V ceramics. However, BZT10:2W ceramic showed a relaxor-like behavior near phase transition characterized by the empirical parameter γ. Piezoelectric force microscopy images reveals that the piezoelectric coefficient is strongly influenced by type of donor dopant suggesting promising applications for dynamic random access memories and data-storage media. Copyright © 2010 American Scientific Publishers All rights reserved. | en |
dc.format.extent | 223-231 | - |
dc.language.iso | eng | - |
dc.source | Scopus | - |
dc.subject | Ceramics | - |
dc.subject | Dieletric response | - |
dc.subject | Dopants | - |
dc.subject | Mixed oxide | - |
dc.subject | Piezoelectricity | - |
dc.subject | Dielectric analysis | - |
dc.subject | Dielectric studies | - |
dc.subject | Donor dopants | - |
dc.subject | Dynamic random access memory | - |
dc.subject | Empirical parameters | - |
dc.subject | Ion motions | - |
dc.subject | Mixed oxide method | - |
dc.subject | Paraelectric transitions | - |
dc.subject | Piezoelectric coefficient | - |
dc.subject | Piezoelectric force microscopy | - |
dc.subject | Polycrystalline | - |
dc.subject | Room temperature | - |
dc.subject | Secondary phasis | - |
dc.subject | SEM analysis | - |
dc.subject | Temperature dependence | - |
dc.subject | Zirconium titanate | - |
dc.subject | Barium | - |
dc.subject | Crystallography | - |
dc.subject | Digital storage | - |
dc.subject | Doping (additives) | - |
dc.subject | Ferroelectric ceramics | - |
dc.subject | Grain growth | - |
dc.subject | Tungsten | - |
dc.subject | Vanadium | - |
dc.subject | X ray diffraction | - |
dc.subject | X ray diffraction analysis | - |
dc.subject | Zirconium | - |
dc.subject | Ceramic materials | - |
dc.title | Microscopic and dielectric analyses of vanadium and tungsten modified barium zirconium titanate ceramics | en |
dc.type | outro | - |
dc.contributor.institution | SCampus Itabira | - |
dc.contributor.institution | Universidade Estadual Paulista (UNESP) | - |
dc.description.affiliation | Universidade Federal de Itajubá-Unifei SCampus Itabira, Rua São Paulo 377, 35900-37, Itabira, Minas Gerais | - |
dc.description.affiliation | Laboratório Interdisciplinar em Cerâmica Instituto de Química Universidade Estadual Paulista, P.O. Box 355, 14801-907, Araraquara, São Paulo | - |
dc.description.affiliationUnesp | Laboratório Interdisciplinar em Cerâmica Instituto de Química Universidade Estadual Paulista, P.O. Box 355, 14801-907, Araraquara, São Paulo | - |
dc.identifier.doi | 10.1166/jamr.2010.1046 | - |
dc.rights.accessRights | Acesso restrito | - |
dc.relation.ispartof | Journal of Advanced Microscopy Research | - |
dc.identifier.scopus | 2-s2.0-84867518058 | - |
Appears in Collections: | Artigos, TCCs, Teses e Dissertações da Unesp |
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