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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/72757
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dc.contributor.authorDe Souza, Flávio Queiroz-
dc.contributor.authorOki, Nobuo-
dc.date.accessioned2014-05-27T11:26:06Z-
dc.date.accessioned2016-10-25T18:34:57Z-
dc.date.available2014-05-27T11:26:06Z-
dc.date.available2016-10-25T18:34:57Z-
dc.date.issued2011-10-25-
dc.identifierhttp://dx.doi.org/10.1145/2020876.2020889-
dc.identifier.citationProceedings - SBCCI2011: 24th Symposium on Integrated Circuits and Systems Design, p. 51-54.-
dc.identifier.urihttp://hdl.handle.net/11449/72757-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/72757-
dc.description.abstractIn this paper, the susceptibility of a current-mode bandgap voltage reference to electromagnetic interference (EMI) superimposed to the power supply is investigated by simulation. Designed for AMS 0.35 CMOS process, the circuit provides a stable voltage reference in the temperature range of -40-150°C. When EMI disturbances are present, the circuit exhibits only 6.7 mV of offset for interfering signals in the frequency range of 150 kHz-1 GHz. © 2011 ACM.en
dc.format.extent51-54-
dc.language.isoeng-
dc.sourceScopus-
dc.subjectbandgap-
dc.subjectcurrent-mode voltage reference.-
dc.subjectelectromagnetic interference-
dc.subjectemi-
dc.subjectsusceptibility-
dc.subjectvoltage reference-
dc.subject0.35 CMOS-
dc.subjectBandgap voltage reference-
dc.subjectCurrent mode-
dc.subjectFrequency ranges-
dc.subjectInterfering signals-
dc.subjectPower supply-
dc.subjectTemperature range-
dc.subjectCMOS integrated circuits-
dc.subjectElectromagnetic pulse-
dc.subjectElectromagnetic wave interference-
dc.subjectElectromagnetism-
dc.subjectEnergy gap-
dc.subjectIntegrated circuits-
dc.subjectSignal interference-
dc.subjectSystems analysis-
dc.subjectVoltage measurement-
dc.titleBandgap voltage reference with low susceptibility to electromagnetic interference (EMI)en
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationDepartamento de Engenharia Elétrica Faculdade de Engenharia de Ilha Solteira-FEIS Universidade Estadual Paulista - UNESP, Avenida Brasil, 56, Centro - Ilha Solteira - SP-
dc.description.affiliationUnespDepartamento de Engenharia Elétrica Faculdade de Engenharia de Ilha Solteira-FEIS Universidade Estadual Paulista - UNESP, Avenida Brasil, 56, Centro - Ilha Solteira - SP-
dc.identifier.doi10.1145/2020876.2020889-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofProceedings - SBCCI2011: 24th Symposium on Integrated Circuits and Systems Design-
dc.identifier.scopus2-s2.0-80054785710-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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