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Utilize este identificador para citar ou criar um link para este item: http://acervodigital.unesp.br/handle/11449/74342
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dc.contributor.authorBueno, Paulo Roberto-
dc.contributor.authorFabregat-Santiago, Francisco-
dc.contributor.authorDavis, Jason J.-
dc.date.accessioned2014-05-27T11:27:33Z-
dc.date.accessioned2016-10-25T18:41:45Z-
dc.date.available2014-05-27T11:27:33Z-
dc.date.available2016-10-25T18:41:45Z-
dc.date.issued2013-01-02-
dc.identifierhttp://dx.doi.org/10.1021/ac303018d-
dc.identifier.citationAnalytical Chemistry, v. 85, n. 1, p. 411-417, 2013.-
dc.identifier.issn0003-2700-
dc.identifier.issn1520-6882-
dc.identifier.urihttp://hdl.handle.net/11449/74342-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/74342-
dc.description.abstractElectrochemical analyses on confined electroactive molecular layers, herein exemplified with electroactive self-assembled monolayers, sample current contributions that are significantly influenced by additional nonfaradaic and uncompensated resistance effects that, though unresolved, can strongly distort redox analysis. Prior work has shown that impedance-derived capacitance spectroscopy approaches can cleanly resolve all contributions generated at such films, including those which are related to the layer dipolar/electrostatic relaxation characteristics. We show herein that, in isolating the faradaic and nonfaradaic contributions present within an improved equivalent circuit description of such interfaces, it is possible to accurately simulate subsequently observed cyclic voltammograms (that is, generated current versus potential patterns map accurately onto frequency domain measurements). Not only does this enable a frequency-resolved quantification of all components present, and in so doing, a full validation of the equivalent circuit model utilized, but also facilitates the generation of background subtracted cyclic voltammograms remarkably free from all but faradaic contributions. © 2012 American Chemical Society.en
dc.format.extent411-417-
dc.language.isoeng-
dc.sourceScopus-
dc.subjectCapacitance spectroscopy-
dc.subjectCircuit description-
dc.subjectCyclic voltammograms-
dc.subjectElectroactive-
dc.subjectElectrochemical analysis-
dc.subjectEquivalent circuit model-
dc.subjectFrequency domain measurement-
dc.subjectMolecular layer-
dc.subjectSelf assembled monolayers-
dc.subjectCapacitance-
dc.titleElucidating capacitance and resistance terms in confined electroactive molecular layersen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.contributor.institutionUniversitat Jaume i-
dc.contributor.institutionUniversity of Oxford-
dc.description.affiliationInstituto de Química Universidade Estadual Paulista, CP 355, 14800-900 Araraquara, São Paulo-
dc.description.affiliationGrup de Dispositius Fotovotaics i OptoelectroÌnics Departament de Física Universitat Jaume i, Av. Sos Baynat, s/n, 12071 Castelló de la Plana-
dc.description.affiliationDepartment of Chemistry University of Oxford, South Parks Road, Oxford OX1 3QZ-
dc.description.affiliationUnespInstituto de Química Universidade Estadual Paulista, CP 355, 14800-900 Araraquara, São Paulo-
dc.identifier.doi10.1021/ac303018d-
dc.identifier.wosWOS:000313156500061-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofAnalytical Chemistry-
dc.identifier.scopus2-s2.0-84871816157-
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