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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/75084
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dc.contributor.authorBaldan, Carlos A.-
dc.contributor.authorLamas, Jerika S.-
dc.contributor.authorBernardes, André A.-
dc.contributor.authorShigue, Carlos Y.-
dc.contributor.authorRuppert, Ernesto-
dc.date.accessioned2014-05-27T11:28:54Z-
dc.date.accessioned2016-10-25T18:47:21Z-
dc.date.available2014-05-27T11:28:54Z-
dc.date.available2016-10-25T18:47:21Z-
dc.date.issued2013-04-08-
dc.identifierhttp://dx.doi.org/10.1109/TASC.2013.2248411-
dc.identifier.citationIEEE Transactions on Applied Superconductivity, v. 23, n. 3, 2013.-
dc.identifier.issn1051-8223-
dc.identifier.urihttp://hdl.handle.net/11449/75084-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/75084-
dc.description.abstractIn this work, we report on the evaluation of a superconducting fault current limiter (SFCL). It is consisted of a modular superconducting device combined with a short-circuited transformer with a primary copper winding connected in series to the power line and the secondary side short-circuited by the superconducting device. The basic idea is adding a magnetic component to contribute to the current limitation by the impedance reflected to the line after transition of the superconducting device. The evaluation tests were performed with a prospective current up to 2 kA, with the short-circuited transformer of 2.5 kVA, 220 V/660 V connected to a test facility of 100 kVA power capacity. The resistive SFCL using a modular superconducting device was tested without degradation for a prospective fault current of 1.8 kA, achieving the limiting factor 2.78; the voltage achieved 282 V corresponding to an electric field of 11 V/m. The test performed with the combined SFCL (xsuperconducting device + transformer) using series and toroidal transformers showed current limiting factor of 3.1 and 2 times, respectively. The test results of the combined SFCL with short-circuited transformer showed undesirable influence of the transformer impedance, resulting in reduction of the fault current level. © 2002-2011 IEEE.en
dc.language.isoeng-
dc.sourceScopus-
dc.subjectCurrent limiting ratio-
dc.subjectstep up transformer-
dc.subjectsuperconducting fault current limiter-
dc.subjectYBCO coated conductor-
dc.subjectCurrent limitation-
dc.subjectCurrent limiting-
dc.subjectMagnetic components-
dc.subjectStep up transformers-
dc.subjectSuperconducting faultcurrent limiters (SFCL)-
dc.subjectToroidal transformers-
dc.subjectTransformer impedances-
dc.subjectYBCO coated conductors-
dc.subjectCritical current density (superconductivity)-
dc.subjectElectric fault currents-
dc.subjectElectric fields-
dc.subjectElectric transformer testing-
dc.subjectSuperconducting devices-
dc.subjectSuperconducting electric lines-
dc.subjectYttrium barium copper oxides-
dc.subjectSuperconducting fault current limiters-
dc.titleFault current limiter using transformer and modular device of YBCO coated conductoren
dc.typeoutro-
dc.contributor.institutionUniversidade de São Paulo (USP)-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.contributor.institutionGhent University-
dc.contributor.institutionUniversidade Estadual de Campinas (UNICAMP)-
dc.description.affiliationEscola de Engenharia de Lorena Universidade de São Paulo-EEL/USP, Lorena-SP 12602-810-
dc.description.affiliationDepartamento de Engenharia Elétrica Universidade Estadual Paulista UNESP, Guaratinguetá SP 12516-410-
dc.description.affiliationDepartment of Solid State Sciences Ghent University, 9000 Ghent-
dc.description.affiliationFaculdade de Engenharia Elétrica e Computação Universidade Estadual de Campinas UNICAMP, Campinas-SP 13083-852-
dc.description.affiliationUnespDepartamento de Engenharia Elétrica Universidade Estadual Paulista UNESP, Guaratinguetá SP 12516-410-
dc.identifier.doi10.1109/TASC.2013.2248411-
dc.identifier.wosWOS:000318895100185-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofIEEE Transactions on Applied Superconductivity-
dc.identifier.scopus2-s2.0-84875755402-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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