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http://acervodigital.unesp.br/handle/11449/75502
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DC Field | Value | Language |
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dc.contributor.author | Nozaki, Ricardo | - |
dc.contributor.author | Balthazar, José Manoel | - |
dc.contributor.author | Tusset, Angelo Marcelo | - |
dc.contributor.author | De Pontes Jr., Bento Rodrigues | - |
dc.contributor.author | Bueno, Átila Madureira | - |
dc.date.accessioned | 2014-05-27T11:29:34Z | - |
dc.date.accessioned | 2016-10-25T18:48:54Z | - |
dc.date.available | 2014-05-27T11:29:34Z | - |
dc.date.available | 2016-10-25T18:48:54Z | - |
dc.date.issued | 2013-06-01 | - |
dc.identifier | http://dx.doi.org/10.1007/s40313-013-0034-1 | - |
dc.identifier.citation | Journal of Control, Automation and Electrical Systems, v. 24, n. 3, p. 223-231, 2013. | - |
dc.identifier.issn | 2195-3880 | - |
dc.identifier.issn | 2195-3899 | - |
dc.identifier.uri | http://hdl.handle.net/11449/75502 | - |
dc.identifier.uri | http://acervodigital.unesp.br/handle/11449/75502 | - |
dc.description.abstract | The performance of the optimal linear feedback control and of the state-dependent Riccati equation control techniques applied to control and to suppress the chaotic motion in the atomic force microscope are analyzed. In addition, the sensitivity of each control technique regarding to parametric uncertainties are considered. Simulation results show the advantages and disadvantages of each technique. © 2013 Brazilian Society for Automatics - SBA. | en |
dc.format.extent | 223-231 | - |
dc.language.iso | eng | - |
dc.source | Scopus | - |
dc.subject | Atomic force microscopy (AFM) | - |
dc.subject | Chaos | - |
dc.subject | Optimal linear feedback control (OLFC) | - |
dc.subject | State-dependent Riccati equation (SDRE) | - |
dc.subject | Atomic force microscope (AFM) | - |
dc.subject | Chaotic motions | - |
dc.subject | Control techniques | - |
dc.subject | Linear feedback control | - |
dc.subject | Parametric errors | - |
dc.subject | Parametric uncertainties | - |
dc.subject | State-dependent Riccati equation | - |
dc.subject | Chaos theory | - |
dc.subject | Feedback control | - |
dc.subject | Optimization | - |
dc.subject | Atomic force microscopy | - |
dc.title | Nonlinear control system applied to atomic force microscope including parametric errors | en |
dc.type | outro | - |
dc.contributor.institution | Universidade Estadual Paulista (UNESP) | - |
dc.contributor.institution | Universidade Tecnológica Federal Do Paraná - UTFPR | - |
dc.description.affiliation | Universidade Estadual Paulista - UNESP, Av. Luiz Edmundo Carrijo Coube, Bauru, SP 14-01 | - |
dc.description.affiliation | Departamento de Estatística Matemática Aplicada e Computacional Universidade Estadual Paulista - UNESP, Avenida 24A. 1515. Bela Vista Caixa-postal: 178, Rio-Claro SP 13506-700 | - |
dc.description.affiliation | Universidade Tecnológica Federal Do Paraná - UTFPR, Av. Monteiro Lobato s.n., km 4, Ponta Grossa, PR 84019-919 | - |
dc.description.affiliationUnesp | Universidade Estadual Paulista - UNESP, Av. Luiz Edmundo Carrijo Coube, Bauru, SP 14-01 | - |
dc.description.affiliationUnesp | Departamento de Estatística Matemática Aplicada e Computacional Universidade Estadual Paulista - UNESP, Avenida 24A. 1515. Bela Vista Caixa-postal: 178, Rio-Claro SP 13506-700 | - |
dc.identifier.doi | 10.1007/s40313-013-0034-1 | - |
dc.rights.accessRights | Acesso restrito | - |
dc.relation.ispartof | Journal of Control, Automation and Electrical Systems | - |
dc.identifier.scopus | 2-s2.0-84879400236 | - |
Appears in Collections: | Artigos, TCCs, Teses e Dissertações da Unesp |
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