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dc.contributor.authorParija, B.-
dc.contributor.authorBadapanda, T.-
dc.contributor.authorRout, S. K.-
dc.contributor.authorCavalcante, L. S.-
dc.contributor.authorPanigrahi, S.-
dc.contributor.authorLongo, Elson-
dc.contributor.authorBatista, N. C.-
dc.contributor.authorSinha, T. P.-
dc.date.accessioned2014-05-27T11:29:48Z-
dc.date.accessioned2016-10-25T18:50:18Z-
dc.date.available2014-05-27T11:29:48Z-
dc.date.available2016-10-25T18:50:18Z-
dc.date.issued2013-07-01-
dc.identifierhttp://dx.doi.org/10.1016/j.ceramint.2012.11.080-
dc.identifier.citationCeramics International, v. 39, n. 5, p. 4877-4886, 2013.-
dc.identifier.issn0272-8842-
dc.identifier.urihttp://hdl.handle.net/11449/75760-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/75760-
dc.description.abstractLead-free solid solutions (1-x)Bi0.5Na0.5TiO 3 (BNT)-xBaZr0.25Ti0.75O3 (BZT) (x=0, 0.01, 0.03, 0.05, and 0.07) were prepared by the solid state reaction method. X-ray diffraction (XRD) and Rietveld refinement analyses of 1-x(BNT)-x(BZT) solid solution ceramic were employed to study the structure of these systems. A morphotropic phase boundary (MPB) between rhombohedral and cubic structures occured at the composition x=0.05. Raman spectroscopy exhibited a splitting of the (TO3) mode at x=0.05 and confirmed the presence of MPB region. Scanning electron microcopy (SEM) images showed a change in the grain shape with the increase of BZT into the BNT matrix lattice. The temperature dependent dielectric study showed a gradual increase in dielectric constant up to x=0.05 and then decrease with further increase in BZT content. Maximum coercive field, remanent polarization and high piezoelectric constant were observed at x=0.05. Both the structural and electrical properties show that the solid solution has an MPB around x=0.05. © 2012 Elsevier Ltd and Techna Group S.r.l.en
dc.format.extent4877-4886-
dc.language.isoeng-
dc.sourceScopus-
dc.subjectC. Electrical property-
dc.subjectPhase boundaries-
dc.subjectRaman spectroscopy-
dc.subjectRietveld refinement-
dc.subjectHigh piezoelectric constant-
dc.subjectLead-free piezoelectric ceramic-
dc.subjectLead-free solid solutions-
dc.subjectMorphotropic phase boundaries-
dc.subjectSolid solution ceramics-
dc.subjectSolid state reaction method-
dc.subjectStructural and electrical properties-
dc.subjectTemperature dependent-
dc.subjectPiezoelectric ceramics-
dc.subjectSodium-
dc.subjectSolid solutions-
dc.subjectSolid state reactions-
dc.subjectX ray diffraction-
dc.subjectElectric properties-
dc.titleMorphotropic phase boundary and electrical properties of 1-x[Bi 0.5Na0.5]TiO3 -xBa[Zr0.25Ti 0.75]O3 lead-free piezoelectric ceramicsen
dc.typeoutro-
dc.contributor.institutionNIT-
dc.contributor.institutionCV Raman College of Engineering-
dc.contributor.institutionBIT-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.contributor.institutionCCN-
dc.contributor.institutionBose Institute-
dc.description.affiliationDepartment of Physics NIT, Rourkela 769008-
dc.description.affiliationDepartment of Physics CV Raman College of Engineering, Bhubaneswar 752054-
dc.description.affiliationDepartment of Applied Physics BIT, Meshra, Ranchi-
dc.description.affiliationUniversidade Estadual Paulista, PO Box 355, CEP 14801-907, Araraquara-SP-
dc.description.affiliationUESPI CCN Departamento de Química, Rua João Cabral, 64002-150 Teresina-PI-
dc.description.affiliationDepartment of Applied Physics Bose Institute, 93/1, A.P.C. Road, Kolkata 700009-
dc.description.affiliationUnespUniversidade Estadual Paulista, PO Box 355, CEP 14801-907, Araraquara-SP-
dc.identifier.doi10.1016/j.ceramint.2012.11.080-
dc.identifier.wosWOS:000318577600018-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofCeramics International-
dc.identifier.scopus2-s2.0-84875726065-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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