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DC Field | Value | Language |
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dc.contributor.author | Foschini, C. R. | - |
dc.contributor.author | Tararam, R. | - |
dc.contributor.author | Simões, A. Z. | - |
dc.contributor.author | Cilense, M. | - |
dc.contributor.author | Longo, Elson | - |
dc.contributor.author | Varela, José Arana | - |
dc.date.accessioned | 2014-05-27T11:29:57Z | - |
dc.date.accessioned | 2016-10-25T18:51:09Z | - |
dc.date.available | 2014-05-27T11:29:57Z | - |
dc.date.available | 2016-10-25T18:51:09Z | - |
dc.date.issued | 2013-07-11 | - |
dc.identifier | http://dx.doi.org/10.1016/j.jallcom.2013.05.216 | - |
dc.identifier.citation | Journal of Alloys and Compounds, v. 574, p. 604-608. | - |
dc.identifier.issn | 0925-8388 | - |
dc.identifier.uri | http://hdl.handle.net/11449/75949 | - |
dc.identifier.uri | http://acervodigital.unesp.br/handle/11449/75949 | - |
dc.description.abstract | Calcium copper titanate, CaCu3Ti4O12, CCTO, thin films with polycrystalline nature have been deposited by RF sputtering on Pt/Ti/SiO2/Si (100) substrates at a room temperature followed by annealing at 600 °C for 2 h in a conventional furnace. The CCTO thin film present a cubic structure with lattice parameter a = 7.379 ±0.001 Å free of secondary phases. The observed electrical features of CCTO thin films are highly dependent on the [CaO12], [CaO 4], [CuO11], [CuO11Vx 0] and [TiO5.VO] clusters. The CCTO film capacitor showed a dielectric loss of 0.40 and a dielectric permittivity of 70 at 1 kHz. The J-V behavior is completely symmetrical, regardless of whether the conduction is limited by interfacial barriers or by bulk-like mechanisms. © 2013 Elsevier B.V. All rights reserved. | en |
dc.format.extent | 604-608 | - |
dc.language.iso | eng | - |
dc.source | Scopus | - |
dc.subject | Chemical synthesis | - |
dc.subject | Electron microscopy | - |
dc.subject | Thin films | - |
dc.subject | X-ray diffraction | - |
dc.subject | Calcium copper titanates | - |
dc.subject | Conventional furnace | - |
dc.subject | Cubic structure | - |
dc.subject | Dielectric permittivities | - |
dc.subject | Interfacial barriers | - |
dc.subject | Polycrystalline | - |
dc.subject | Room temperature | - |
dc.subject | Secondary phasis | - |
dc.subject | Dielectric losses | - |
dc.subject | Permittivity | - |
dc.subject | Synthesis (chemical) | - |
dc.subject | X ray diffraction | - |
dc.title | CaCu3Ti4O12 thin films with non-linear resistivity deposited by RF-sputtering | en |
dc.type | outro | - |
dc.contributor.institution | Universidade Estadual Paulista (UNESP) | - |
dc.description.affiliation | Universidade Estadual Paulista - UNESP Faculdade de Engenharia de Bauru Dept. de Eng. Mecânica, Av. Eng. Luiz Edmundo C. Coube 14-01, CEP 17033-360 Bauru, SP | - |
dc.description.affiliation | Universidade Estadual Paulista - UNESP Instituto de Química, Rua Prof. Francisco Degni no. 55, CEP 14800-900 Araraquara, SP | - |
dc.description.affiliation | Universidade Estadual Paulista - UNESP Faculdade de Engenharia de Guaratinguetá, Av. Dr. Ariberto Pereira da Cunha, no. 333, CEP 12516-410 Guaratinguetá, SP | - |
dc.description.affiliationUnesp | Universidade Estadual Paulista - UNESP Faculdade de Engenharia de Bauru Dept. de Eng. Mecânica, Av. Eng. Luiz Edmundo C. Coube 14-01, CEP 17033-360 Bauru, SP | - |
dc.description.affiliationUnesp | Universidade Estadual Paulista - UNESP Instituto de Química, Rua Prof. Francisco Degni no. 55, CEP 14800-900 Araraquara, SP | - |
dc.description.affiliationUnesp | Universidade Estadual Paulista - UNESP Faculdade de Engenharia de Guaratinguetá, Av. Dr. Ariberto Pereira da Cunha, no. 333, CEP 12516-410 Guaratinguetá, SP | - |
dc.identifier.doi | 10.1016/j.jallcom.2013.05.216 | - |
dc.identifier.wos | WOS:000321749600097 | - |
dc.rights.accessRights | Acesso restrito | - |
dc.relation.ispartof | Journal of Alloys and Compounds | - |
dc.identifier.scopus | 2-s2.0-84879825033 | - |
Appears in Collections: | Artigos, TCCs, Teses e Dissertações da Unesp |
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