Please use this identifier to cite or link to this item:
http://acervodigital.unesp.br/handle/11449/76306
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Wünsche, Julia | - |
dc.contributor.author | Cicoira, Fabio | - |
dc.contributor.author | Graeff, Carlos Frederico de Oliveira | - |
dc.contributor.author | Santato, Clara | - |
dc.date.accessioned | 2014-05-27T11:30:11Z | - |
dc.date.accessioned | 2016-10-25T18:52:45Z | - |
dc.date.available | 2014-05-27T11:30:11Z | - |
dc.date.available | 2016-10-25T18:52:45Z | - |
dc.date.issued | 2013-08-21 | - |
dc.identifier | http://dx.doi.org/10.1039/c3tb20630k | - |
dc.identifier.citation | Journal of Materials Chemistry B, v. 1, n. 31, p. 3836-3842, 2013. | - |
dc.identifier.issn | 2050-7518 | - |
dc.identifier.issn | 2050-750X | - |
dc.identifier.uri | http://hdl.handle.net/11449/76306 | - |
dc.identifier.uri | http://acervodigital.unesp.br/handle/11449/76306 | - |
dc.description.abstract | Eumelanin pigments show hydration-dependent conductivity, broad-band UV-vis absorption, and chelation of metal ions. Solution-processing of synthetic eumelanins opens new possibilities for the characterization of eumelanin in thin film form and its integration into bioelectronic devices. We investigate the effect of different synthesis routes and processing solvents on the growth, the morphology, and the chemical composition of eumelanin thin films using atomic force microscopy and X-ray photoelectron spectroscopy. We further characterize the films by transient electrical current measurements obtained at 50% to 90% relative humidity, relevant for bioelectronic applications. We show that the use of dimethyl sulfoxide is preferable over ammonia solution as processing solvent, yielding homogeneous films with surface roughnesses below 0.5 nm and a chemical composition in agreement with the eumelanin molecular structure. These eumelanin films grow in a quasi layer-by-layer mode, each layer being composed of nanoaggregates, 1-2 nm high, 10-30 nm large. The transient electrical measurements using a planar two-electrode device suggest that there are two contributions to the current, electronic and ionic, the latter being increasingly dominant at higher hydration, and point to the importance of time-dependent electrical characterization of eumelanin films. This journal is © 2013 The Royal Society of Chemistry. | en |
dc.format.extent | 3836-3842 | - |
dc.language.iso | eng | - |
dc.source | Scopus | - |
dc.subject | Bioelectronic applications | - |
dc.subject | Bioelectronic device | - |
dc.subject | Chemical compositions | - |
dc.subject | Electrical characterization | - |
dc.subject | Electrical measurement | - |
dc.subject | Layer-by layer mode | - |
dc.subject | Solution-processing | - |
dc.subject | UV-vis absorptions | - |
dc.subject | Atomic force microscopy | - |
dc.subject | Dimethyl sulfoxide | - |
dc.subject | Hydration | - |
dc.subject | Metal ions | - |
dc.subject | Photoelectrons | - |
dc.subject | Power quality | - |
dc.subject | Surface roughness | - |
dc.subject | Thin films | - |
dc.subject | Transport properties | - |
dc.subject | X ray photoelectron spectroscopy | - |
dc.subject | Melanin | - |
dc.title | Eumelanin thin films: Solution-processing, growth, and charge transport properties | en |
dc.type | outro | - |
dc.contributor.institution | École Polytechnique de Montréal | - |
dc.contributor.institution | Universidade Estadual Paulista (UNESP) | - |
dc.description.affiliation | Département de Génie Physique École Polytechnique de Montréal, Succursale Centre-Ville, Montréal, QC H3C 3A7 | - |
dc.description.affiliation | Département de Génie Chimique École Polytechnique de Montréal, Succursale Centre-Ville, Montréal, QC H3C 3A7 | - |
dc.description.affiliation | DF-FC UNESP-Univ. Estadual Paulista, Av. Eng. Luiz Edmundo Carrijo Coube 14-01, 17033-360 Bauru | - |
dc.description.affiliationUnesp | DF-FC UNESP-Univ. Estadual Paulista, Av. Eng. Luiz Edmundo Carrijo Coube 14-01, 17033-360 Bauru | - |
dc.identifier.doi | 10.1039/c3tb20630k | - |
dc.identifier.wos | WOS:000321905900013 | - |
dc.rights.accessRights | Acesso restrito | - |
dc.identifier.file | 2-s2.0-84880578281.pdf | - |
dc.relation.ispartof | Journal of Materials Chemistry B | - |
dc.identifier.scopus | 2-s2.0-84880578281 | - |
dc.identifier.orcid | 0000-0003-0162-8273 | pt |
Appears in Collections: | Artigos, TCCs, Teses e Dissertações da Unesp |
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.