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http://acervodigital.unesp.br/handle/11449/76307
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DC Field | Value | Language |
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dc.contributor.author | Oliveira, Tâmara R. | - |
dc.contributor.author | Falcão-Filho, Edilson L. | - |
dc.contributor.author | De Araújo, Cid B. | - |
dc.contributor.author | Da Silva, Diego S. | - |
dc.contributor.author | Kassab, Luciana R. P. | - |
dc.contributor.author | Da Silva, Davinson M. | - |
dc.date.accessioned | 2014-05-27T11:30:11Z | - |
dc.date.accessioned | 2016-10-25T18:52:45Z | - |
dc.date.available | 2014-05-27T11:30:11Z | - |
dc.date.available | 2016-10-25T18:52:45Z | - |
dc.date.issued | 2013-08-21 | - |
dc.identifier | http://dx.doi.org/10.1063/1.4818502 | - |
dc.identifier.citation | Journal of Applied Physics, v. 114, n. 7, 2013. | - |
dc.identifier.issn | 0021-8979 | - |
dc.identifier.uri | http://hdl.handle.net/11449/76307 | - |
dc.identifier.uri | http://acervodigital.unesp.br/handle/11449/76307 | - |
dc.description.abstract | The nonlinear (NL) optical properties of glassy xBi2O 3-(1-x) GeO2 with x = 0.72 and 0.82 were investigated. The experiments were performed with lasers at 800 nm (pulses of 150 fs) and 532 nm (pulses of 80 ps and 250 ns). Using the Kerr gate technique, we observed that the NL response of the samples at 800 nm is faster than 150 fs. NL refraction indices, | n 2 | ≈ 5 × 10-16 cm2/W, and two-photon absorption coefficients, α 2, smaller than 0.03 cm/GW, were measured at 800 nm. At 532 nm, we measured the NL transmittance of the samples. From the results obtained, we determined α 2 ≈1 cm/GW and excited-state absorption cross-sections of ≈10-22 cm2 due to free-carriers. © 2013 AIP Publishing LLC. | en |
dc.language.iso | eng | - |
dc.source | Scopus | - |
dc.subject | Excited state absorption | - |
dc.subject | Free carriers | - |
dc.subject | Kerr gates | - |
dc.subject | Non-linear optical properties | - |
dc.subject | Refraction index | - |
dc.subject | Two-photon absorptions | - |
dc.subject | Two photon processes | - |
dc.subject | Glass | - |
dc.title | Nonlinear optical properties of Bi2O3-GeO2 glass at 800 and 532 nm | en |
dc.type | outro | - |
dc.contributor.institution | Universidade Estadual da Paraíba | - |
dc.contributor.institution | Universidade Federal de Pernambuco (UFPE) | - |
dc.contributor.institution | Universidade de São Paulo (USP) | - |
dc.contributor.institution | Universidade Estadual Paulista (UNESP) | - |
dc.description.affiliation | Departamento de Física Universidade Estadual da Paraíba, 58429-500 Campina Grande, PB | - |
dc.description.affiliation | Departamento de Física Universidade Federal de Pernambuco, 50670-901 Recife, PE | - |
dc.description.affiliation | Departamento de Engenharia de Sistemas Eletrônicos Escola Politécnica Universidade de São Paulo, 05508-970 São Paulo, SP | - |
dc.description.affiliation | Laboratório de Tecnologia em Materiais Fotônicos e Optoeletrônicos Faculdade de Tecnologia de São Paulo CEETEPS/UNESP, 01124-060 São Paulo, SP | - |
dc.description.affiliationUnesp | Laboratório de Tecnologia em Materiais Fotônicos e Optoeletrônicos Faculdade de Tecnologia de São Paulo CEETEPS/UNESP, 01124-060 São Paulo, SP | - |
dc.identifier.doi | 10.1063/1.4818502 | - |
dc.identifier.wos | WOS:000323510900012 | - |
dc.rights.accessRights | Acesso restrito | - |
dc.identifier.file | 2-s2.0-84883309617.pdf | - |
dc.relation.ispartof | Journal of Applied Physics | - |
dc.identifier.scopus | 2-s2.0-84883309617 | - |
Appears in Collections: | Artigos, TCCs, Teses e Dissertações da Unesp |
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