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dc.contributor.authorPontes, Fenelon Martinho Lima-
dc.contributor.authorGalhiane, Mario Sergio-
dc.contributor.authorSantos, L. S.-
dc.contributor.authorPetit, L. A.-
dc.contributor.authorKataoka, F. P.-
dc.contributor.authorMabuchi, G. H.-
dc.contributor.authorLongo, Elson-
dc.contributor.authorZampieri, M.-
dc.contributor.authorPizani, P. S.-
dc.date.accessioned2014-05-20T13:26:53Z-
dc.date.accessioned2016-10-25T16:46:56Z-
dc.date.available2014-05-20T13:26:53Z-
dc.date.available2016-10-25T16:46:56Z-
dc.date.issued2009-05-27-
dc.identifierhttp://dx.doi.org/10.1016/j.jallcom.2008.10.134-
dc.identifier.citationJournal of Alloys and Compounds. Lausanne: Elsevier B.V. Sa, v. 477, n. 1-2, p. 608-615, 2009.-
dc.identifier.issn0925-8388-
dc.identifier.urihttp://hdl.handle.net/11449/8731-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/8731-
dc.description.abstractStoichiometric XWO(4) (X = Ca, and Sr) thin films were synthesized using the polymeric precursor method. In this soft chemical method, soluble precursors such as strontium carbonate, calcium carbonate and tungstic acid, as starting materials, were mixed in an aqueous solution. Through the polyesterification reaction, evidences of the formation of the W-citrate complex and the strontium were obtained by (13)C NMR and FT-Raman spectroscopy. The thin films were deposited on silicon and platinum-coated silicon substrates through the spinning technique. The surface morphology and crystal structure of the thin films were investigated using atomic force microscopy (AFM), X-ray diffraction (XRD), specular reflectance infrared Fourier transform spectroscopy, and micro-Raman spectroscopy. Nucleation stages and surface morphology evolution of the thin films on silicon substrates were studied by atomic force microscopy. X-ray diffraction characterization of these films showed that the XWO(4) (X = Ca, and Sr) thin film phases crystallize at 500 degrees C from an inorganic amorphous phase, given that no intermediate crystalline phase was identified. (C) 2008 Elsevier B.V. All rights reserved.en
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)-
dc.format.extent608-615-
dc.language.isoeng-
dc.publisherElsevier B.V. Sa-
dc.sourceWeb of Science-
dc.subjectThin filmsen
dc.subjectChemical synthesisen
dc.subjectX-ray diffractionen
dc.titlePolymeric precursor method to the synthesis of XWO(4) (X = Ca and Sr) thin films-Structural, microstructural and spectroscopic investigationsen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.contributor.institutionUniversidade Federal de São Carlos (UFSCar)-
dc.description.affiliationUniv Estadual Paulista, LAMAC, Dept Chem, BR-17033360 São Paulo, Brazil-
dc.description.affiliationUniv Estadual Paulista, Inst Chem, BR-14801970 São Paulo, Brazil-
dc.description.affiliationUniversidade Federal de São Carlos (UFSCar), LIEC, CMDMC, Dept Chem, BR-13565905 São Paulo, Brazil-
dc.description.affiliationUniversidade Federal de São Carlos (UFSCar), Dept Phys, BR-13565905 São Paulo, Brazil-
dc.description.affiliationUnespUniv Estadual Paulista, LAMAC, Dept Chem, BR-17033360 São Paulo, Brazil-
dc.description.affiliationUnespUniv Estadual Paulista, Inst Chem, BR-14801970 São Paulo, Brazil-
dc.description.sponsorshipIdFAPESP: 06/53926-4-
dc.description.sponsorshipIdFAPESP: 08/53513-7-
dc.identifier.doi10.1016/j.jallcom.2008.10.134-
dc.identifier.wosWOS:000266386400122-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofJournal of Alloys and Compounds-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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