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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/9368
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dc.contributor.authorSimões, Alexandre Zirpoli-
dc.contributor.authorRiccardi, C. S.-
dc.contributor.authorRies, A.-
dc.contributor.authorRamirez, M. A.-
dc.contributor.authorLongo, Elson-
dc.contributor.authorVarela, José Arana-
dc.date.accessioned2014-05-20T13:28:13Z-
dc.date.accessioned2016-10-25T16:47:58Z-
dc.date.available2014-05-20T13:28:13Z-
dc.date.available2016-10-25T16:47:58Z-
dc.date.issued2008-01-21-
dc.identifierhttp://dx.doi.org/10.1016/j.jmatprotec.2007.06.039-
dc.identifier.citationJournal of Materials Processing Technology. Lausanne: Elsevier B.V. Sa, v. 196, n. 1-3, p. 10-14, 2008.-
dc.identifier.issn0924-0136-
dc.identifier.urihttp://hdl.handle.net/11449/9368-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/9368-
dc.description.abstractThe effect of film orientation on piezoelectric and ferroelectric properties of bismuth layered compounds deposited on platinum coated silicon substrates was investigated. Piezo-force microscopy was used to probe the local piezoelectric properties of Bi(4)Ti(3)O(12), CaBi(4)Ti(4)O(15) and SrBi(4)Ti(4)O(15) films. Our measurements on individual grains clearly reveal that the local piezoelectric properties are determined by the polarization state of the grain. A piezoelectric coefficient of 65 pm/V was attained after poling in a grain with a polar axis very close to the normal direction. The piezoelectric coefficient and the remanent polarization were larger for a-b axes oriented than for c-axis-oriented films. (c) 2007 Elsevier B.V All rights reserved.en
dc.language.isoeng-
dc.publisherElsevier B.V. Sa-
dc.sourceWeb of Science-
dc.subjectferroelectricityen
dc.subjectthin-filmen
dc.subjectpiezoelectricityen
dc.titleFerroelectric and piezoelectric properties of bismuth layered thin films grown on (100) Pt electrodesen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationUniv Estadual Paulista, UNESP, Inst Chem, BR-14801970 Araraquara, SP, Brazil-
dc.description.affiliationUnespUniv Estadual Paulista, UNESP, Inst Chem, BR-14801970 Araraquara, SP, Brazil-
dc.identifier.doi10.1016/j.jmatprotec.2007.06.039-
dc.identifier.wosWOS:000252623200002-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofJournal of Materials Processing Technology-
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