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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/9419
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dc.contributor.authorSimões, Alexandre Zirpoli-
dc.contributor.authorRamirez, M. A.-
dc.contributor.authorFoschini, C. R.-
dc.contributor.authorMoura, F.-
dc.contributor.authorVarela, José Arana-
dc.contributor.authorLongo, Elson-
dc.date.accessioned2014-05-20T13:28:18Z-
dc.date.accessioned2016-10-25T16:48:04Z-
dc.date.available2014-05-20T13:28:18Z-
dc.date.available2016-10-25T16:48:04Z-
dc.date.issued2012-07-01-
dc.identifierhttp://dx.doi.org/10.1016/j.ceramint.2012.01.034-
dc.identifier.citationCeramics International. Oxford: Elsevier B.V., v. 38, n. 5, p. 3841-3849, 2012.-
dc.identifier.issn0272-8842-
dc.identifier.urihttp://hdl.handle.net/11449/9419-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/9419-
dc.description.abstractBi0.85La0.15FeO3 (BLFO015) thin films were deposited by the polymeric precursor solution on La0.5Sr0.5CoO3 substrates. For comparison, the films were also deposited on Pt bottom electrode. X-ray diffraction data confirmed the substitutions of La into the Bi site with the elimination of all secondary phases under a substitution ratio x = 15% at a temperature of 500 degrees C for 2 h. A substantial increase in the remnant polarization (P-r) with La0.5Sr0.5CoO3 bottom electrode (P-r approximate to 34 mu C/cm(2)) after a drive voltage of 9 V was observed when compared with the same film deposited on Pt substrate. The leakage current behavior at room temperature decreased from 10(-8) (Pt) to 10(-10) A/cm(2) on (La0.5Sr0.5CoO3) electrode under a voltage of 5 V. The fatigue resistance of the Au/BLFO015/LSCO/Pt/TiO2/SiO2/Si (1 0 0) capacitors with a thickness of 280 nm exhibited no degradation after 1 x 10(8) switching cycles at a frequency of 1 MHz. (C) 2012 Elsevier Ltd and Techna Group S.r.l. All rights reserved.en
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)-
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)-
dc.format.extent3841-3849-
dc.language.isoeng-
dc.publisherElsevier B.V.-
dc.sourceWeb of Science-
dc.subjectFilmsen
dc.subjectInterfacesen
dc.subjectDielectric propertiesen
dc.subjectFerroelectric propertiesen
dc.titleEnhanced ferroelectric properties of La-substituted BiFeO3 thin films on LaSrCoO3/Pt/TiO2/SiO2/Si (100) substrates prepared by the soft chemical methoden
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.contributor.institutionUniversidade Federal de Itajubá (UNIFEI)-
dc.description.affiliationUniv Estadual Paulista Unesp, Fac Engn Guaratingueta, BR-12516410 Guaratingueta, SP, Brazil-
dc.description.affiliationUniversidade Federal de Itajubá (UNIFEI) Unifei, BR-3590037 Itabira, MG, Brazil-
dc.description.affiliationUniv Estadual Paulista Unesp, Inst Quim, BR-14800900 Araraquara, SP, Brazil-
dc.description.affiliationUnespUniv Estadual Paulista Unesp, Fac Engn Guaratingueta, BR-12516410 Guaratingueta, SP, Brazil-
dc.description.affiliationUnespUniv Estadual Paulista Unesp, Inst Quim, BR-14800900 Araraquara, SP, Brazil-
dc.identifier.doi10.1016/j.ceramint.2012.01.034-
dc.identifier.wosWOS:000303634900043-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofCeramics International-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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