You are in the accessibility menu

Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/9513
Full metadata record
DC FieldValueLanguage
dc.contributor.authorHo, Linda Lee-
dc.contributor.authorBranco Costa, Antonio Fernando-
dc.date.accessioned2014-05-20T13:28:34Z-
dc.date.accessioned2016-10-25T16:48:14Z-
dc.date.available2014-05-20T13:28:34Z-
dc.date.available2016-10-25T16:48:14Z-
dc.date.issued2009-08-01-
dc.identifierhttp://dx.doi.org/10.1007/s00170-008-1746-4-
dc.identifier.citationInternational Journal of Advanced Manufacturing Technology. Artington: Springer London Ltd, v. 43, n. 7-8, p. 744-755, 2009.-
dc.identifier.issn0268-3768-
dc.identifier.urihttp://hdl.handle.net/11449/9513-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/9513-
dc.description.abstractIn this paper, three single-control charts are proposed to monitor individual observations of a bivariate Poisson process. The specified false-alarm risk, their control limits, and ARLs were determined to compare their performances for different types and sizes of shifts. In most of the cases, the single charts presented better performance rather than two separate control charts ( one for each quality characteristic). A numerical example illustrates the proposed control charts.en
dc.format.extent744-755-
dc.language.isoeng-
dc.publisherSpringer London Ltd-
dc.sourceWeb of Science-
dc.subjectControl chartsen
dc.subjectBivariate Poisson distributionen
dc.subjectARLen
dc.titleControl charts for individual observations of a bivariate Poisson processen
dc.typeoutro-
dc.contributor.institutionUniversidade de São Paulo (USP)-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationUniv São Paulo, São Paulo, Brazil-
dc.description.affiliationSão Paulo State Univ, São Paulo, Brazil-
dc.description.affiliationUnespSão Paulo State Univ, São Paulo, Brazil-
dc.identifier.doi10.1007/s00170-008-1746-4-
dc.identifier.wosWOS:000268808300012-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofInternational Journal of Advanced Manufacturing Technology-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

There are no files associated with this item.
 

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.