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Campo DC | Valor | Idioma |
---|---|---|
dc.contributor.author | Mammana, S. S. | - |
dc.contributor.author | Degasperi, F. T. | - |
dc.contributor.author | Salvadori, M. C. | - |
dc.contributor.author | Sparapani, D. C. | - |
dc.contributor.author | Laino, M. F. | - |
dc.contributor.author | Rangel, R. C. | - |
dc.contributor.author | Teixeira, F. S. | - |
dc.contributor.author | Cattani, M. | - |
dc.date.accessioned | 2014-05-27T11:22:45Z | - |
dc.date.accessioned | 2016-10-25T18:25:03Z | - |
dc.date.available | 2014-05-27T11:22:45Z | - |
dc.date.available | 2016-10-25T18:25:03Z | - |
dc.date.issued | 2007-12-19 | - |
dc.identifier | http://dx.doi.org/10.1116/1.2790924 | - |
dc.identifier.citation | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, v. 25, n. 6, p. 1804-1807, 2007. | - |
dc.identifier.issn | 1071-1023 | - |
dc.identifier.uri | http://hdl.handle.net/11449/70217 | - |
dc.identifier.uri | http://acervodigital.unesp.br/handle/11449/70217 | - |
dc.description.abstract | In this article, the authors measure throughput of sonic diamond microtubes and micronozzles that can work as passive gas flow controllers and flow meters under choking conditions. The behavior of the outlet pressure through the microdevices using an experimental setup with constant volume and constant temperature was determined in order to obtain the critical throughput, the critical mass flow rate, and the discharge coefficients of the diamond sonic microdevices. © 2007 American Vacuum Society. | en |
dc.format.extent | 1804-1807 | - |
dc.language.iso | eng | - |
dc.source | Scopus | - |
dc.subject | Diamonds | - |
dc.subject | Flow rate | - |
dc.subject | Flowmeters | - |
dc.subject | Throughput | - |
dc.subject | Discharge coefficients | - |
dc.subject | Microdevices | - |
dc.subject | Micronozzles | - |
dc.subject | Microtubes | - |
dc.subject | Sonic flow | - |
dc.subject | Flow control | - |
dc.title | Critical parameter determination of sonic flow controller diamond microtubes and micronozzles | en |
dc.type | outro | - |
dc.contributor.institution | Universidade de São Paulo (USP) | - |
dc.contributor.institution | Universidade Estadual Paulista (UNESP) | - |
dc.description.affiliation | Institute of Physics University of São Paulo, CP 66318, CEP 05315-970 São Paulo, São Paulo | - |
dc.description.affiliation | Faculdade de Tecnologia de São Paulo Centro Estadual de Educa̧ão Tecnológica Paula Souza (CEETEPS) UNESP-São Paulo, São Paulo | - |
dc.description.affiliationUnesp | Faculdade de Tecnologia de São Paulo Centro Estadual de Educa̧ão Tecnológica Paula Souza (CEETEPS) UNESP-São Paulo, São Paulo | - |
dc.identifier.doi | 10.1116/1.2790924 | - |
dc.rights.accessRights | Acesso restrito | - |
dc.identifier.file | 2-s2.0-37149002798.pdf | - |
dc.relation.ispartof | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures | - |
dc.identifier.scopus | 2-s2.0-37149002798 | - |
Aparece nas coleções: | Artigos, TCCs, Teses e Dissertações da Unesp |
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