You are in the accessibility menu

Please use this identifier to cite or link to this item:
Full metadata record
DC FieldValueLanguage
dc.contributor.authorde Oliveira Hein, Luis Rogerio-
dc.contributor.authorde Campos, Kamila Amato-
dc.contributor.authorReis de Oliveira Caltabiano, Pietro Carelli-
dc.identifier.citationMicron. Oxford: Pergamon-Elsevier B.V. Ltd, v. 43, n. 10, p. 1039-1049, 2012.-
dc.description.abstractUncoated fracture surfaces of carbon-epoxy composites are investigated using a variable-pressure environmental scanning electron microscope (VP-ESEM), under optimized conditions for topographic description, image quality and sample preservation. Always using freeware or open source programs, parameters for low-voltage and low vacuum are stipulated with the support of Monte Carlo simulations combined to topographic measurements, tailoring the VP-ESEM setup for visualization of fine relief details. Based on topographic information from atomic force microscope (AFM) images, finest fracture steps were measured. These were the references to optimize and define boundaries for applied beam voltages and chamber pressures, restricted by the beam penetration depth and gas-electron interactions, guided by Monte Carlo simulations and signal-to-noise measurements. For VP mode, ideal chamber pressure was found around 30-40 Pa at 3 keV beam voltage and 6 mm working distance. Lower pressures will cause noise due to electron charging and gas excess provokes resolution degradation and noise due to positive charging and electron beam scattering, raising the skirt radius. When a larger working distance is necessary, it can be compensated by adjusting the detector bias and the probe current, or even lowering chamber pressure, but the signal-to-noise ratio will certainly change. Monte Carlo simulations provided a good approach to optimize imaging conditions under low vacuum and low voltage for fractographic analysis of carbon-epoxy composites. (C) 2012 Elsevier Ltd. All rights reserved.en
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)-
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)-
dc.publisherPergamon-Elsevier B.V. Ltd-
dc.sourceWeb of Science-
dc.subjectMonte Carloen
dc.subjectLow voltageen
dc.subjectVariable pressure scanning electron microscopeen
dc.subjectSignal-to-noise ratioen
dc.titleLow voltage and variable-pressure scanning electron microscopy of fractured compositesen
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationUNESP Univ Estadual Paulista, DMT Dept Mat & Technol, LAIMat Mat Image Anal Lab, BR-12516410 Guaratingueta, SP, Brazil-
dc.description.affiliationUnespUNESP Univ Estadual Paulista, DMT Dept Mat & Technol, LAIMat Mat Image Anal Lab, BR-12516410 Guaratingueta, SP, Brazil-
dc.rights.accessRightsAcesso restrito-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

There are no files associated with this item.

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.